Electron-momentum spectroscopy of crystal silicon

Zhang, Fang; Matthews, R. S.; Utteridge, S.; Vos, Maarten; Canney, S. A.; Guo, X.; McCarthy, I. E.; Weigold, E.

doi:10.1103/physrevb.57.12882

Cited by 10 publications

(12 citation statements)

References 14 publications

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“…To date, energy-momentum densities have been measured by EMS almost exclusively for amorphous and polycrystalline targets [16]. Measurements have been reported for crystalline graphite [17], and an investigation of diffraction effects in EMS from a crystalline Si target has been performed by Fang et al [18]. The electronic structure of Si measured by EMS has, so far, only been reported for the amorphous state [19].…”

Section: Introductionmentioning

confidence: 99%

Energy-resolved momentum densities for the valence band of a nanoscale Si single crystal

Sashin

Canney

Ford

et al. 1999

J. Phys.: Condens. Matter

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We have measured the energy-and momentum-resolved band structure, and ground state of occupation of the bands, for a crystalline silicon sample along the 100 and 110 directions. Band structures were determined directly by the technique of electron momentum spectroscopy (EMS) for a self-supporting Si membrane with a thickness of approximately 7 nm. We compare our experimental results with ab initio calculations for bulk crystalline silicon performed within the linear muffin tin orbital approximation. Qualitative agreement is seen between experiment and theory for the main valence band peak. Additional intensity is observed in the measurement on either side of the main peak and is attributed mainly to multiple-scattering events. Satellite structure could also be present in these additional features, although there is no direct evidence for this.

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Section: Introductionmentioning

confidence: 99%

Energy-resolved momentum densities for the valence band of a nanoscale Si single crystal

Sashin

Canney

Ford

et al. 1999

J. Phys.: Condens. Matter

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“…6,7 Very impressive electron momentum density maps have been obtained on a number of systems, such as highly oriented pyrolytic graphite (HOPG), Si, SiC, Al and Cu. 8,9 However, in order for the incident beam to penetrate the specimen, relatively thin foils (∼100Å) have to be prepared, which is technically difficult, and this limits the number of systems that can be studied. Furthermore, the transmission (e,2e) technique is not inherently surface-sensitive.…”

Section: Introductionmentioning

confidence: 99%

Electron Momentum Spectroscopy of Surfaces

et al. 1999

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Electron momentum spectroscopy [binary (e,2e) spectroscopy] using transmission geometry is a unique experimental tool for imaging the electron momentum distribution in gas phase samples as well as in thin films. In a solid, the electron momentum distribution is related to the band structure. Development of the (e,2e) technique using a more versatile reflection geometry is attractive since a much wider range of surfaces could be studied. The design of a new reflection (e,2e) spectrometer is presented. It is based on a two-step scattering model in which an incident electron successively reflects and ejects a valence electron from the surface. The scattered and ejected electrons are detected in coincidence and their energies and momentum vectors are simultaneously determined using a high throughput 90 • truncated spherical electrostatic analyzer and position-sensitive detectors.

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“…However, we have not yet seen any experimental data that cannot be described by this simplified model. For a complete quantitative, theoretical analysis see earlier published work [9,6,10]. To keep the language simple we assume that the target electrons are independent particles each with a well defined momentum p e :…”

Section: Ems With Diffractionmentioning

confidence: 99%

“…Single crystal EMS data are scarce. They are confined to graphite [4,5] and silicon [6,7]. The published silicon data, obtained with the Flinders University EMS spectrometer, are difficult to interpret due to high levels of multiple scattering.…”

Section: Introductionmentioning

confidence: 99%

Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

Vos

Kheifets

Sashin

et al. 2003

Journal of Physics and Chemistry of Solids

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Electron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different orientations of the crystal relative to the analysers. By comparing these spectra for which the measured momentum density is the same, but the diffraction conditions of the incoming and outgoing electron trajectories differ, one can distinguish between features due to diffraction of the incoming and/or outgoing electrons, and those due to the electronic structure of the target itself. q

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Electron-momentum spectroscopy of crystal silicon

Cited by 10 publications

References 14 publications

Energy-resolved momentum densities for the valence band of a nanoscale Si single crystal

Energy-resolved momentum densities for the valence band of a nanoscale Si single crystal

Electron Momentum Spectroscopy of Surfaces

Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

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