2003
DOI: 10.1016/j.jpcs.2003.08.004
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Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

Abstract: Electron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different orientations of the crystal… Show more

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Cited by 5 publications
(6 citation statements)
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References 18 publications
(21 reference statements)
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“…In a crystal coherent elastic scattering by the nuclear sites (dynamic diffraction) of the incident and/or the emitted electrons can shift the observed momentum distribution by a reciprocal lattice vector G [41,42,43]. In the present experiment the electron momenta are all very large (k 0 = 62.1 a.u., k 1,2 = 43.4 a.u.…”
Section: Diffraction Effectsmentioning
confidence: 59%
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“…In a crystal coherent elastic scattering by the nuclear sites (dynamic diffraction) of the incident and/or the emitted electrons can shift the observed momentum distribution by a reciprocal lattice vector G [41,42,43]. In the present experiment the electron momenta are all very large (k 0 = 62.1 a.u., k 1,2 = 43.4 a.u.…”
Section: Diffraction Effectsmentioning
confidence: 59%
“…In this way contributions due to diffraction can be removed on the assumption that there is no interference between the direct and diffracted electron waves. The study of any possible interference effects could lead to additional information on the structure of silicon [41].…”
Section: Discussionmentioning
confidence: 99%
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