Electron microscopy image enhanced

Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen; Rose, H.; Kabius, B.; Urban, K.

doi:10.1038/33823

Cited by 1,020 publications

(588 citation statements)

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“…An advanced probe corrector derived from the hexapole-type corrector from CEOS corrects for objective lens illumination aberrations (Haider et al 2000;Müller et al 2006). The imaging aberration corrector is a hexapole-type corrector from CEOS (Haider et al 1998). The high-resolution Ultratwin objective lens has an inherent third-order spherical aberration coefficient C 3 (= C s ) of 0.66 mm (300 kV) and a (relativistic) coefficient of chromatic aberration C c of 1.64 mm.…”

Section: Instrument Parameters and Performancementioning

confidence: 99%

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Dahmen

Erni

Radmilović

et al. 2009

Phil. Trans. R. Soc. A.

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The strong interaction of electrons with small volumes of matter make them an ideal probe for nanomaterials, but our ability to fully use this signal in electron microscopes remains limited by lens aberrations. To bring this unique advantage to bear on materials research requires a sample space for electron scattering experiments in a tunable electron-optical environment. This is the vision for the Transmission Electron Aberrationcorrected Microscope (TEAM) project, which was initiated as a collaborative effort to re-design the electron microscope around aberration-correcting optics. The resulting improvements in spatial, spectral and temporal resolution, the increased space around the sample and the possibility of exotic electron-optical settings will enable new types of experiments. This contribution will give an overview of the TEAM project and its current status, illustrate the performance of the TEAM 0.5 instrument, with highlights from early applications of the machine, and outline future scientific opportunities for aberration-corrected microscopy.Keywords: aberration correction; depth sectioning; monochromator; single-atom detection; light atom imaging; electron microscopy Overview of the Transmission Electron Aberration-corrected Microscope projectRecent advances in aberration-correcting electron optics have led to increased resolution, sensitivity and signal-to-noise (S/N) ratio in atomic resolution microscopy. These advances have created the opportunity to directly observe the atomic-scale order, electronic structure and dynamics of individual nanoscale objects by advanced transmission electron microscopy (TEM). To take advantage of this opportunity, the Transmission Electron Aberration-corrected Microscope (TEAM) project was initiated to optimize the electron microscope around aberration-corrected electron optics and to further advance the limits of the instrument and the technique. The project brings together several leading microscopy groups supported by the US Department of Energy's (DOE's) Office *Author for correspondence (udahmen@lbl.gov).One contribution of 14 to a Discussion Meeting Issue 'New possibilities with aberration-corrected electron microscopy'. http://www.science.doe.gov). After its completion, the instrument will be made available to the scientific user community at the National Center for Electron Microscopy (NCEM).The vision for the TEAM project is the idea of providing a sample space for electron scattering experiments in a tunable electron-optical environment by removing some of the constraints that have limited electron microscopy until now. The resulting improvements in spatial, spectral and temporal resolution, the increased space around the sample and the possibility of setting up novel electronoptical configurations will enable new types of experiments in electron scattering. The TEAM microscope will feature unique corrector elements for spherical and chromatic aberrations, a novel atomic-force-microscopy-inspired specimen stage, a high-brightness gun and numerous other in...

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Section: Instrument Parameters and Performancementioning

confidence: 99%

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Dahmen

Erni

Radmilović

et al. 2009

Phil. Trans. R. Soc. A.

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“…[3][4][5][6][7]. Aberration correctors can be used either post-specimen to improve image resolution and contrast in transmission electron microscopy (TEM) [1] or pre-specimen to produce a more sharply focused probe for scanning transmission electron microscopy (STEM) [2,8].…”

Section: Introductionmentioning

confidence: 99%

“…After correction of resolution-limiting spherical aberration became feasible several years ago [1,2], electron microscopy has developed into a tool to accurately determine atomic positions, local elemental composition, and bonding with very high precision [e.g. [3][4][5][6][7].…”

Section: Introductionmentioning

confidence: 99%

Aberration corrected STEM by means of diffraction gratings

Linck¹,

Ercius

Pierce

et al. 2017

Ultramicroscopy

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Abstract:In the past 15 years, the advent of aberration correction technology in electron microscopy has enabled materials analysis on the atomic scale. This is made possible by complex arrangements of multipole electrodes and magnetic solenoids to compensate the aberrations inherent to any focusing element of an electron microscope. Here, we describe an alternative method to correct for the spherical aberration of the objective lens in a scanning transmission electron microscopy (STEM) using a passive, nanofabricated diffractive optical element. This holographic device is installed in the probe forming aperture of a conventional electron microscope and can be designed to remove arbitrarily complex aberrations from the electron's wave front. In this work, we show a proof of principle experiment that demonstrates successful correction of the spherical aberration in STEM by means of such a grating corrector (GCOR). Our GCOR enables us to record aberration-corrected high-resolution HAADF STEM images, although yet without any improvement in probe current and resolution. Author Contact Information:Dr. Martin Linck, CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany

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“…Applications of these techniques in the area of catalytic materials, functional oxides and electronic materials have emerged since the first aberrationcorrected microscopes were developed over 10 years ago [1][2][3][4][5]. New developments in commercial instruments have, furthermore, made it possible to significantly broaden the impact of these new technological developments.…”

mentioning

confidence: 99%

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Lazar

Chang²,

Gunawan

et al. 2009

Microsc Microanal

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Aberration-corrected microscopy and new generations of instruments have the potential of significantly improving the development of new materials by providing superior imaging resolution, stability and spectroscopic capabilities. Applications of these techniques in the area of catalytic materials, functional oxides and electronic materials have emerged since the first aberrationcorrected microscopes were developed over 10 years ago [1][2][3][4][5]. New developments in commercial instruments have, furthermore, made it possible to significantly broaden the impact of these new technological developments. Here we report on example where aberration-corrected instruments have provided significant benefits in various areas of applications related to the study of electronic properties of complex oxides and nanoscale materials such as carbon nanotubes.Experiments were carried out with a FEI Titan 80-300 Cubed equipped with two aberration correctors and a monochromator. This instrument achieved an information limit of 0.65-0.6Å, a STEM information transfer of better than 0.7Å and an energy resolution in EELS of 0.13eV. STEM imaging of the multiferroic compound Bi 2 Fe x Cr y O 6 has revealed the well-resolved transition metal sites between Bi bi-layers suggesting, directly from the High-Angle Annular Dark-Field HAADF images, similarities with an Aurivillius-type structure for this material (figure 1) that provides new insight on the magnetic properties of the thin films [6]. Energy-loss spectroscopy measurements at the CrL 2-3 and FeL 2-3 edges were also used to determine the valence of the Fe and Cr atoms. Phase contrast images also revealed additional information on the layer-by-layer growth mechanism of the films and the nature of defects at the interface with the SrRuO 3 substrate.With highly stable instrumentation, detailed information on the structure and roughness of interfaces can be provided by HAADF STEM. For example, in (Ba 0.4 Sr 0.6 )(Ti 0.5 Nb 0.5 )O 3 metallic oxide thin films deposited on MgAl 2 O 4 substrates, HAADF imaging (figure 2) provides direct evidence of lateral roughness at the level of few atomic cells. Combined with complementary focal series reconstruction of the phase contrast images, the STEM data provides detailed information necessary to understand the electronic structure changes of the first few atomic layers of these metallic oxide thin films in perfect epitaxial registry with the substrate (and less than 0.5% lattice mismatch). EELS data demonstrated the subtle changes in the Ti L 23 edges as compared to reference compounds with nominally similar Ti 3+ valence (Figure 3). These results suggest that strain can induce valence changes.Examples demonstrating the benefits of aberration-corrected low accelerating voltage microscopy in the study of carbon-based nanostructures show that it is possible to visualize single polymer chains wrapped around nanotubes (Figure 4) through the process of supramolecular functionalization [7] and other approaches [8,9].

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Electron microscopy image enhanced

Cited by 1,020 publications

References 0 publications

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

Aberration corrected STEM by means of diffraction gratings

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

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