Aberration corrected STEM by means of diffraction gratings

Linck, Martin; Ercius, Peter; Pierce, Jordan; McMorran, Benjamin

doi:10.1016/j.ultramic.2017.06.008

Cited by 16 publications

(10 citation statements)

References 47 publications

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“…We show in related work that atomic resolution phase measurement is possible with a higher convergence angle and aberration correction [41]. Aberrations can be corrected holographically with the grating [42].…”

Section: Discussionmentioning

confidence: 99%

Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter

et al. 2018

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Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a nanofabricated diffraction grating to produce multiple probe beams. The measured phase is more interpretable than phase-contrast scanning transmission electron microscopy techniques without an off-axis reference wave, and the resolution could surpass that of off-axis electron holography. We apply the technique to image nanoparticles, carbon substrates and electric fields. The contrast observed in experiments agrees well with contrast predicted in simulations.

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Section: Discussionmentioning

confidence: 99%

Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter

et al. 2018

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“…Despite recent proposals [21], electron microscopes cannot yet be equipped with devices that are able to impart arbitrary phase distributions to electrons. An important example of progress towards achieving adaptive optics for electrons, albeit without full flexibility, is provided by the development of hardware for correcting the spherical aberration of electron lenses, most powerfully by using magnetic multipole elements to compensate for different orders of aberrations [22] and more simply by using thin film phase masks [23,24,25].…”

Section: Introductionmentioning

confidence: 99%

Design of electrostatic phase elements for sorting the orbital angular momentum of electrons

Pozzi

Grillo

et al. 2020

Ultramicroscopy

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The orbital angular momentum (OAM) sorter is a new electron optical device for measuring an electron's OAM. It is based on two phase elements, which are referred to as the "unwrapper"and "corrector"and are placed in Fourier-conjugate planes in an electron microscope. The most convenient implementation of this concept is based on the use of electrostatic phase elements, such as a charged needle as the arXiv:1906.02344v1 [physics.ins-det] 5 Jun 2019Electrostatic sorter for electrons carrying orbital angular momentum 2 unwrapper and a set of electrodes with alternating charges as the corrector. Here, we use simulations to assess the role of imperfections in such a device, in comparison to an ideal sorter. We show that the finite length of the needle and the boundary conditions introduce astigmatism, which leads to detrimental cross-talk in the OAM spectrum. We demonstrate that an improved setup comprising three charged needles can be used to compensate for this aberration, allowing measurements with a level of cross-talk in the OAM spectrum that is comparable to the ideal case.

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“…Material diffractive electron optics have the capacity to sculpt the electron matter wave arbitrarily up to nanofabrication resolution limits. The resulting hologram can impart both phase and amplitude modulation, combining significant design flexibility [1][2] with the sub-nanoscale imaging of the TEM to support a multitude of applications [3][4][5][6]. This level of control, however, requires maximizing grating output into the proper diffraction order to ensure a detectable proportion of electrons interact with the sample.…”

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confidence: 99%