2013
DOI: 10.1016/b978-0-08-098259-5.00011-1
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Electron Microscopy

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Cited by 9 publications
(4 citation statements)
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“…With the development of the CFEGs, an ultrahigh vacuum (10 −8 –10 –9 Pa) system is required for cryo-EM ( El-Gomati et al, 2021 ). The ultrahigh vacuum system removes vaporized water from the vitrified sample and contaminants near the tip and prevents interference from the electron beam and induces electron diffraction by the contaminants and water molecules ( Kogure, 2013 ; Cheng, 2015 ).…”
Section: Technical Advancements In Cryo-em For High-resolution Struct...mentioning
confidence: 99%
“…With the development of the CFEGs, an ultrahigh vacuum (10 −8 –10 –9 Pa) system is required for cryo-EM ( El-Gomati et al, 2021 ). The ultrahigh vacuum system removes vaporized water from the vitrified sample and contaminants near the tip and prevents interference from the electron beam and induces electron diffraction by the contaminants and water molecules ( Kogure, 2013 ; Cheng, 2015 ).…”
Section: Technical Advancements In Cryo-em For High-resolution Struct...mentioning
confidence: 99%
“…The first component of a SEM is the electron gun [50]. Conventional electron guns use thermal energy to emit electrons from a cathode.…”
Section: Basic Sem Physicsmentioning
confidence: 99%
“…This value is a little smaller than the basal spacing derived from the XRD result. This is because the high voltage of TEM test (200 kV) would destroy the interlayer surfactants and/or dehydration of the interlayer space (Kogure, 2013). Hence, the basal spacing calculated from the TEM depended on the voltage, test time, thermal stability of organic compounds and the thickness of samples.…”
Section: Sem and Temmentioning
confidence: 99%