Electron Microscope Specimen Preparation Techniques in materials Science

Thompson-Russell, K. C.; Edington, J. W.

doi:10.1007/978-1-349-03403-1_1

Cited by 21 publications

(12 citation statements)

References 542 publications

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“…25 The structural analyses of the constituent phases were conducted using high-resolution transmission electron microscopy (HRTEM; TECNAI G 2 F20, 200 keV, FEI). Uniaxial compression tests were carried out on л 2 mm (diam.)…”

Section: Methodsmentioning

confidence: 99%

High-strength Cu–Zr binary alloy with an ultrafine eutectic microstructure

Kim¹,

Ahn

Lee

et al. 2008

J. Mater. Res.

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In this study, we synthesized Cu-Zr binary alloys reinforced with an ultrafine eutectic microstructure. The alloys consisted of alternating layers of a hard superlattice phase and a ductile Cu phase with a very fine interlamellar spacing of ∼60 nm. The superlattice phase enhanced the strength of the alloys while the laminated composite structure helped improve their plasticity, making their mechanical properties comparable to those of the earlier reported high strength alloys. This paper discusses the fundamental microstructural aspects that influence the mechanical properties of these alloys.

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Section: Methodsmentioning

confidence: 99%

High-strength Cu–Zr binary alloy with an ultrafine eutectic microstructure

Kim¹,

Ahn

Lee

et al. 2008

J. Mater. Res.

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show abstract

“…Fortunately, it is easier to prepare TEM samples of structural material because most of them have conductive nature. Electro-chemical thinning has been widely used for a TEM sample preparation [1].…”

Section: Introductionmentioning

confidence: 99%

Modified preparation technique of TEM sample for various TEM analyses of structural materials

et al. 2012

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“…The techniques for preparing samples for electron optical examination are critical, whether the requirement is for thin specimens suitable for electron microscopy or smooth surfaces on solid samples for electron-probe microanalysis. Such methods are well documented in the literature (Bramman andYates 1968, Thompson-Russell andEdington 1977), and most procedures which have been developed for specific types of materials analysis may involve mechanical (grinding and polishing), chemical (etching), electro-chemical (electro-polishing), or physical (ion-beam thinning) methods or carefully selected combinations of these. Each particular technique has its advantages and disadvantages and may cause the introduction of contamination into the work chamber.…”

Section: Introductionmentioning

confidence: 99%