2012
DOI: 10.1016/j.matlet.2012.08.069
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Modified preparation technique of TEM sample for various TEM analyses of structural materials

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Cited by 16 publications
(4 citation statements)
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“…The layer is thought to be formed due to the redeposition of sputtered matrix onto the crack surface introduced by the fiber/RZ cracking when the specimen was being sputtered in the PIPS. This is consistent with a previous report that the redeposition of the sputtered matrix atoms onto the TEM specimen surface is due to low-angle or continuous long-time ion milling (Rao et al, 2010; Jin et al, 2012). On the other hand, Ti has a considerably higher milling rate than C at low-ion incidence angles.…”
Section: Resultssupporting
confidence: 93%
“…The layer is thought to be formed due to the redeposition of sputtered matrix onto the crack surface introduced by the fiber/RZ cracking when the specimen was being sputtered in the PIPS. This is consistent with a previous report that the redeposition of the sputtered matrix atoms onto the TEM specimen surface is due to low-angle or continuous long-time ion milling (Rao et al, 2010; Jin et al, 2012). On the other hand, Ti has a considerably higher milling rate than C at low-ion incidence angles.…”
Section: Resultssupporting
confidence: 93%
“…observation reported in literature (Jin et al, 2012;Rao et al, 2010). Further, a blank gap where no species were detected by the EDS is observed between the interfacial RZ and matrix redeposition layer in the linescan profiles, corresponding to the brightest band related to the separation denoted in Figure 4(a).…”
Section: Scrutiny Ofmentioning
confidence: 86%
“…[31] Transmission electron microscopy (TEM, Tecnai G2 F20 S-Twin) was used to observe the attachment of silver nanoparticles to the mesh. [32] Thermogravimetric analysis (TGA, SDT Q600) could be used to determine the thermal stability of aerogel. [33] Generally, the temperature range was 40%800 °C.…”
Section: Characterizationmentioning
confidence: 99%