Electron Emission From Small Microtips

Sáenz, J. J.; Garcia, N.; Raedt, Hans De; Binh, Vu Thien

doi:10.1051/jphyscol:1989813

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Distance Versus Voltage In the Constant Current Mode1

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1996

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“…13,14 The current density J͑r S ͒ at each point of the emitter surface, r S , is obtained from a one-dimensional model, 15 J͑r S ͒Ϸ em…”

Section: Distance Versus Voltage In the Constant Current Modementioning

confidence: 99%

Current characteristics in near field emission scanning tunneling microscopes

Mesa¹

1996

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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The operation of the scanning tunneling microscope (STM) in the near field emission regime provides a direct, noninvasive approach for investigating surfaces at nanometer scale. Here, we present a study of the current characteristics in a near field emission STM. The influence of tip’s geometry is analyzed. We show that the electron field emission from the sample is stable against tip-shape changes due to adsorbate diffusion or atomic rearrangements.

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“…13,14 The current density J͑r S ͒ at each point of the emitter surface, r S , is obtained from a one-dimensional model, 15 J͑r S ͒Ϸ em…”

Section: Distance Versus Voltage In the Constant Current Modementioning

confidence: 99%

Current characteristics in near field emission scanning tunneling microscopes

Mesa¹

1996

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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show abstract

Electron Emission

Czack¹,

Kirschstein²,

Kurtz³

et al. 1993

W Tungsten

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Electron holography of long-range electric and magnetic fields

Matteucci

Missiroli

Nichelatti

et al. 1991

Journal of Applied Physics

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The influence of the perturbed reference wave in electron holography is considered for the case of static electromagnetic microfields, whose extension around the observed specimen cannot be neglected. These microfields are called ‘‘long-range’’ to distinguish them from the ‘‘short-range’’ ones, whose extension is strictly limited within the object wave and hence do not perturb the reference wave. Optical reconstructions of experimental holograms of simple electrostatic or magnetic long-range fields have been modeled and simulated. The results indicate that perturbation effects must be taken into account when long-range microfields are investigated by electron holography; it is also shown that their influence can be minimized by increasing the interference distance between the object and reference wave.

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Electron Emission From Small Microtips

Cited by 4 publications

References 0 publications

Current characteristics in near field emission scanning tunneling microscopes

Current characteristics in near field emission scanning tunneling microscopes

Electron Emission

Electron holography of long-range electric and magnetic fields

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