Electron Ejection from Solids by Atomic Particles with Kinetic Energy

Krebs, K.H.

doi:10.1002/prop.19680160802

Cited by 108 publications

(12 citation statements)

References 112 publications

(16 reference statements)

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“…We have shown essentially all of the yield data for clean metallic surfaces that we have found for energies below about 1 keV. At higher ion energies, these data are only a sample that available [37][38][39][40][42][43][44]. A short summary of the cleaning procedure is given with the reference.…”

Section: Beam Results For Clean Metalsmentioning

confidence: 97%

Cold-cathode discharges and breakdown in argon: surface and gas phase production of secondary electrons

Phelps

Petrović

1999

Plasma Sources Sci. Technol.

803

856

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We review the data and models describing the production of the electrons, termed secondary electrons, that initiate the secondary and subsequent feedback avalanches required for the growth of current during breakdown and for the maintenance of low-current, cold-cathode discharges in argon. First we correlate measurements of the production of secondary electrons at metallic cathodes, i.e. the yields of electrons induced by Ar + ions, fast Ar atoms, metastable atoms and vuv photons. The yields of electrons per ion, fast atom and photon vary greatly with particle energy and surface condition. Then models of electron, ion, fast atom, excited atom and photon transport and kinetics are fitted to electrical-breakdown and low-current, discharge-maintenance data to determine the contributions of various cathode-directed species to the secondary electron production. Our model explains measured breakdown and low-current discharge voltages for Ar over a very wide range of electric field to gas density ratios E/n, i.e. 15 Td to 100 kTd. We review corrections for nonequilibrium electron motion near the cathode that apply to our local-field model of these discharges. Analytic expressions for the cross sections and reaction coefficients used by this and related models are summarized.

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Section: Beam Results For Clean Metalsmentioning

confidence: 97%

Cold-cathode discharges and breakdown in argon: surface and gas phase production of secondary electrons

Phelps

Petrović

1999

Plasma Sources Sci. Technol.

803

856

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“…40 and 73. Due to the lack of available data for the fast-atom emission yield c a ðeÞ on the molybdenum surface, we assumed the ratio c a ðeÞ=c i ðeÞ to be the same as the ratio of secondary yields for a "clean" cathode, for which experimental data 74 are available. The secondary electron yields are plotted in Fig.…”

Section: Secondary Electron Emissionmentioning

confidence: 99%

Investigation of the Paschen curve for helium in the 100–1000 kV range

Khrabrov

Kaganovich

et al. 2017

Physics of Plasmas

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The left branch of the Paschen curve for helium gas is studied both experimentally and by means of particle-in-cell/Monte Carlo collision (PIC/MCC) simulations. The physical model incorporates electron, ion, and fast atom species whose energy-dependent anisotropic scattering on background neutrals, as well as backscattering at the electrodes, is properly accounted for. For the range of breakdown voltage 15 kV V br 130 kV, a good agreement is observed between simulations and available experimental results for the discharge gap d ¼ 1.4 cm. The PIC/MCC model is used to predict the Paschen curve at higher voltages up to 1 MV, based on the availability of input atomic data. We find that the pd similarity scaling does hold and that above 300 kV, the value of pd at breakdown begins to increase with increasing voltage. To achieve good agreement between PIC/ MCC predictions and experimental data for the Paschen curve, it is essential to account for impact ionization by fast atoms (produced in charge exchange) and ions and for anisotropic scattering of all species on background atoms. With the increase of the applied voltage, energetic fast atoms progressively dominate in the overall ionization rate. The model makes this clear by predicting that breakdown would occur even without electron-and ion-induced ionization of the background gas, due to ionization by fast atoms backscattered at the cathode, and their high production rate in charge exchange collisions. Multiple fast neutrals per ion are produced when the free path is small compared to the electrode gap. Published by AIP Publishing.

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“…Therefore, the Inconel sample behaves as ''dirty'' material having an oxide layer and surface adsorbates, which typically results in a different value of ␥ than surfaces sputter cleaned or deposited in situ under UHV conditions. [35][36][37][38] However, these results can be directly applied to MCP operation since the detector input surface is typically not cleaned in situ before the detector is used. Using this method, the secondary electron yield for 20 keV protons normally incident on Inconel was measured to be 3.6.…”

Section: Secondary Electron Yield Measurementmentioning

confidence: 99%

Effect of local electric fields on microchannel plate detection of incident 20 keV protons

Funsten

Suszcynsky

Harper

et al. 1996

Review of Scientific Instruments

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Absolute detection efficiencies of a microchannel plate detector for 0.5-5 keV neutrals Rev. Sci. Instrum. 81, 063301 (2010); 10.1063/1.3442514Current response characteristics of microchannel plates xray detector using synchrotron radiation (0.6-2 keV and 5-20 keV) Rev. Sci. Instrum. 59, 252 (1988);Relative electron detection efficiency of microchannel plates from 0-3 keV Rev.We present data demonstrating the influence of an applied electric field E oriented normal to the input surface of a microchannel plate ͑MCP͒ detector on the critical operating parameters of the detector, including the quantum detection efficiency, the spatial resolution, and pulse height distribution. The MCP detector response is characterized using 20 keV protons as the primary radiation. An applied electric field EϽϪ4 V/mm, where a negative value of E corresponds to a nearby object that is biased positive relative to the input surface, results in a high spatial resolution and a quantum detection efficiency that is approximately equal to the open area ratio of the MCP. An electric field Ϫ1ϽEϽ5 V/mm results in low spatial resolution, in which up to 32% of the measured signal appears as a localized noise that extends several millimeters from the point of ion impact, and a maximum quantum detection efficiency of approximately 0.87. Furthermore, a separate peak in the pulse-height distribution arises from ions striking the web of the MCP detector and has a much lower pulse magnitude than that of ions striking channels. For EϾ5 V/mm, the spatial resolution increases, and the quantum detection efficiency slightly decreases from its maximum value with increasing E. The characteristics of each of these electric field configurations are analyzed in the context of the yield and transport of secondary electrons created at the web of the MCP detector, and the results can be scaled to other ions and energies according to the secondary electron yield of ions striking the web.

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Electron Ejection from Solids by Atomic Particles with Kinetic Energy

Cited by 108 publications

References 112 publications

Cold-cathode discharges and breakdown in argon: surface and gas phase production of secondary electrons

Cold-cathode discharges and breakdown in argon: surface and gas phase production of secondary electrons

Investigation of the Paschen curve for helium in the 100–1000 kV range

Effect of local electric fields on microchannel plate detection of incident 20 keV protons

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