Electron diffraction studies of strain in epitaxial bicrystals and multilayers

Influence of Experimental Parameters on the Determination of Tetragonal Distortion in Heterostructures by LACBED

“…This expression is coincident with the one previously reported by Cherns et al [8] In Figure 2 is plotted the parameter f lq versus k for f =0.01. It is evident that k has a negligible influence on f /7î: for instance in the case of te = ts =100 nm, f /1J differs from unity by just 0.005.…”

Effects of tetragonal distortion in thin expitaxic films on electron channeling patterns in scanning electron microscopy

“…At the other extreme, Rutherford backscattering is applicable to nanometer films (Hamdi et al, 1985). Recently, transmission electron microscopy and convergent-beam electron diffraction were used to measure misfit strains in NiSi2 grown onto (001)Si and (lll)Si (Cherns, Kelly & Preston, 1988). The results are promising, but buckling of the stressed film after thinning the substrate makes this potentially very accurate method difficult to apply in practice.…”

“…Experimentally it is characterized by a variety of techniques, including X-ray diffraction (Bartels, 1983;Bartels & Nijman, 1978;Bassignana & Tan, 1989;Bensoussan, Malgrange & Sauvage-Simkin, 1987;Chu, Macrander, Strege & Johnston, 1985;Fewster, 1982;Hornstra & Bartels, 1978;Ishida, Matsui, Kamejima & Sakuma, 1975;Matsui, Onabe, Kamejima & Hayashi, 1979;Olsen, Nuese & Smith, 1978;Olsen & Smith, 1975), transmission electron microscopy (Cherns, Kelly & Preston, 1988), backscattering spectrometry with ion channeling (Hamdi, Speriosu, Tandon & Nicolet, 1985) and by other spectrometric techniques (Lee & Laidig, 1984). The most accurate results are given by the X-ray techniques, mainly double-and triple-crystal diffractometry.…”

Strain fields at contacts between small particles

“…Equation (18) has been used to calculate the stress level due to "coherent" precipitates and the results are given in italics in Table 2.…”

“…They can be due, e.g., to dislocation networks building up the boundary or to single dislocations which have interacted with the boundary. In [18][19][20], e.g., misfit strains in multilayers have been dealt with. An alternative source for the stress could be misfit particles in the boundary.…”