1955
DOI: 10.1021/ja01622a011
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Electron Diffraction Investigation of Tetramethylcyclodi- and Hexamethylcyclotrisilthiane

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Cited by 27 publications
(2 citation statements)
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“…Experimentally determined structures of a number of other four-membered rings related to cyclodisiloxanes do not show the existence of abnormally short Si..Si contacts. These include rings containing nitrogen, _2:2.59/~ (Parkanyi et al 1980), carbon, _3:2.70/~ (Vilkov et al 1968), and sulphur, 4 2.84 A (Yokoi et al 1955;Yokoi 1957). Thus, oxygen appears to be unique in inducing a phantom bond, among the structures studied.…”
Section: Introductionmentioning
confidence: 91%
“…Experimentally determined structures of a number of other four-membered rings related to cyclodisiloxanes do not show the existence of abnormally short Si..Si contacts. These include rings containing nitrogen, _2:2.59/~ (Parkanyi et al 1980), carbon, _3:2.70/~ (Vilkov et al 1968), and sulphur, 4 2.84 A (Yokoi et al 1955;Yokoi 1957). Thus, oxygen appears to be unique in inducing a phantom bond, among the structures studied.…”
Section: Introductionmentioning
confidence: 91%
“…Cyclic dimers form four-membered disilthiane rings with the Si-S-Si angle equal to 75°, which corresponds to 80° in fourmembered rings of silicon disulfide [732]. In the siloxane series, where there is delocalization of the free p-electron pairs of the oxygen atom due to the vacant 3d-orbitals of the silicon atom, the formation of a compound with such valence angles is impossible [349].…”
Section: Physical Propertiesmentioning
confidence: 99%