1996
DOI: 10.1016/0167-9317(95)00366-5
|View full text |Cite
|
Sign up to set email alerts
|

Electron beam technology—SEM to microcolumn

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
12
0

Year Published

1996
1996
2007
2007

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 49 publications
(15 citation statements)
references
References 20 publications
0
12
0
Order By: Relevance
“…In this concept, the beamlets are separated everywhere in the machine in order to prevent Coulomb interactions. In some systems, every beamlet has its own full electron optics with electron source, lenses, alignment coils, stigmators, etc., [22][23][24][25][26][27], so each column is a small SEM or Gaussian electron beam machine. The lenses and deflector units are made using MEMS technology, as shown in Fig.…”
Section: Discussion Of Systems Using Memsmentioning
confidence: 99%
“…In this concept, the beamlets are separated everywhere in the machine in order to prevent Coulomb interactions. In some systems, every beamlet has its own full electron optics with electron source, lenses, alignment coils, stigmators, etc., [22][23][24][25][26][27], so each column is a small SEM or Gaussian electron beam machine. The lenses and deflector units are made using MEMS technology, as shown in Fig.…”
Section: Discussion Of Systems Using Memsmentioning
confidence: 99%
“…Maybe, the x-axis of the mesh-square of sample 1 is tilted from that of sample 2 with some angle. (2) The alignment of the column component from the optical axis would not be perfect (therefore, we applied the bias voltage to the upper electrodes of deflector to shift the beam), which will result in the directional error of each beam. There- fore, the incident angle of one electron beam to its sample plane may be different from that of the other.…”
Section: Simultaneous Operationmentioning
confidence: 99%
“…The experimental result achieved with a 1 keV low-energy microcolumn proved the probe beam diameter of 10 nm with a beam current of $1 nA at a working distance of 1 mm [1]. Arrayed microcolumn operation was also proposed and demonstrated for sub-100 nm lithography [2][3][4]. It is reported that multi-beam microcolumn can offer the throughput of 25 wafers per hour (WPH) on 300 mm wafer with 50 nm patterning resolution [3].…”
Section: Introductionmentioning
confidence: 97%
See 2 more Smart Citations