Electromigration recovery and short lead effect under bipolar- and unipolar-pulse current

Lee, Ki‐Don

doi:10.1109/irps.2012.6241869

Cited by 40 publications

(22 citation statements)

References 13 publications

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“…Some investigators have observed damage recovery or relaxation of the stress gradient under PDC and other interrupted current conditions. 1,3,4 Maiz also observed recovery under current reversal conditions at low frequencies. 3 In this work we investigate the argument that at low frequency, when current flow is interrupted, the stress gradient is sufficient to effectively counter the effect of EM and allow stress relaxation and consequently longer lifetimes.…”

Section: Introductionmentioning

confidence: 80%

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Stress relaxation in pulsed DC electromigration measurements

Ringler

Lloyd

2016

AIP Advances

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When a high current density is applied to a conductor, it activates several driving forces for mass transport that can lead to device failure, the most prominent of which is electromigration. However, there are other driving forces operating as well that can counteract or add to the effects of electromigration. A major driving force is a stress gradient that is developed as a response to electromigration in the presence of a blocking boundary condition. When the electrical stress is interrupted by pulsing DC measurements at low frequency, relaxation of the stress is observed through longer lifetime.

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Section: Introductionmentioning

confidence: 80%

“…3 In this work we investigate the argument that at low frequency, when current flow is interrupted, the stress gradient is sufficient to effectively counter the effect of EM and allow stress relaxation and consequently longer lifetimes. 1,2,4 …”

Section: Introductionmentioning

confidence: 99%

Stress relaxation in pulsed DC electromigration measurements

Ringler

Lloyd

2016

AIP Advances

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“…For example, at stress time (t f ) = t 50 , z and FF consistently evaluate to 0 and 0.5, respectively. In signal wires, currents flow in both directions, leading to a limited damage recovery, which can be incorporated by an empirically estimated recovery factor, ξ , used for adjusting the computed average current density in Black's equation [12], as:…”

Section: A Electromigration Basicsmentioning

confidence: 99%

A Fast and Retargetable Framework for Logic-IP-Internal Electromigration Assessment Comprehending Advanced Waveform Effects

Jain

Cortadella

Sapatnekar

2016

IEEE Trans. VLSI Syst.

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Abstract-A new methodology for system-on-chip-level logic-IP-internal electromigration verification is presented in this paper, which significantly improves accuracy by comprehending the impact of the parasitic RC loading and voltage-dependent pin capacitance in the library model. It additionally provides an on-the-fly retargeting capability for reliability constraints by allowing arbitrary specifications of lifetimes, temperatures, voltages, and failure rates, as well as interoperability of the IPs across foundries. The characterization part of the methodology is expedited through the intelligent IP-response modeling. The ultimate benefit of the proposed approach is demonstrated on a 28-nm design by providing an on-the-fly specification of retargeted reliability constraints. The results show a high correlation with SPICE and were obtained with an order of magnitude reduction in the verification runtime.

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“…For more general cases of bi-polar currents, transient current EM analysis uses an effective-EM current density of [20]:…”

Section: Effective-em Currentmentioning

confidence: 99%

Redundancy-aware Electromigration checking for mesh power grids

Chatterjee

Fawaz

Najm

2013

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

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Electromigration (EM) is re-emerging as a significant problem in modern integrated circuits (IC). Especially in power grids, due to shrinking wire widths and increasing current densities, there is little or no margin left between the predicted EM stress and that allowed by the EM design rules. Statistical Electromigration Budgeting (SEB) estimates the reliability of the grid by considering it entirely as a series system. However, a power grid with its many parallel paths has much inherent redundancy. In this work, we propose a new model to estimate the MTF and reliability of the power grid under the influence of EM, which accounts for these redundancies. We refer to this as the mesh model.To implement the mesh model, we also develop a framework to estimate the change in statistics of an interconnect as its effective-EM current varies. The proposed algorithm is quite fast and has an overall observed empirical complexity of O(n 1.5−1.6 ). The resultsindicate that the series model, which is currently used in the industry, gives a pessimistic estimate of power grid MTF and reliability by a factor of 3-4.ii

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Electromigration recovery and short lead effect under bipolar- and unipolar-pulse current

Cited by 40 publications

References 13 publications

Stress relaxation in pulsed DC electromigration measurements

Stress relaxation in pulsed DC electromigration measurements

A Fast and Retargetable Framework for Logic-IP-Internal Electromigration Assessment Comprehending Advanced Waveform Effects

Redundancy-aware Electromigration checking for mesh power grids

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