2015
DOI: 10.1016/j.apsusc.2015.09.056
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Electrochromic properties of NiO :H films deposited by DC magnetron sputtering for ITO/NiO :H/ZrO2/WO3/ITO device

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Cited by 75 publications
(40 citation statements)
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“…Furthermore, a depth-dependent distribution is found in Li concentration. The present work on degradation mechanism in a full device is a continuation of earlier studies of ours [16][17][18][19] showing enhanced EC performance such as enlarged optical contrast, fast switching response and improved durability, WO 3 -1 and NiO-1 (from ECD1); WO 3 -2 and NiO-2 (from ECD2); and WO 3 -3 and NiO-3 (from ECD3), respectively.…”
Section: Fabrication Of Ecds and Electro-optical Measurementssupporting
confidence: 55%
“…Furthermore, a depth-dependent distribution is found in Li concentration. The present work on degradation mechanism in a full device is a continuation of earlier studies of ours [16][17][18][19] showing enhanced EC performance such as enlarged optical contrast, fast switching response and improved durability, WO 3 -1 and NiO-1 (from ECD1); WO 3 -2 and NiO-2 (from ECD2); and WO 3 -3 and NiO-3 (from ECD3), respectively.…”
Section: Fabrication Of Ecds and Electro-optical Measurementssupporting
confidence: 55%
“…In addition, the peak fitting of XPS analysis exhibited several peaks at the binding energy of: ∼778.3 eV (metallic Co), ∼780.5 eV (CoOOH), and ∼782.0 eV (Co(OH) 2 ) in the Co 2 p 3/2 spectrum and ~852.5 eV (metallic Ni), ~855.6 eV (Ni(OH) 2 ), and ~856.5 eV (Ni 2 O 3 ) in the Ni 2 p 3/2 spectrum (Supplementary Fig. 13 ) 54 57 . These peaks indicated the formation of oxide/hydroxides, including metallic species, probably due to surface oxidation and/or hydroxide formation during electrodeposition, which in part agreed with EQCM analysis (Eqs.…”
Section: Resultsmentioning
confidence: 99%
“…Due to this transfer, the films get colored. During the cathodic scan, the reduction of Ni 3+ to Ni 2+ causes the bleaching of the film [36].…”
Section: Electrochemical Measurementsmentioning
confidence: 99%