2019
DOI: 10.1016/j.mssp.2019.01.011
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Electro-thermal modeling for InxGa1-xN/GaN based quantum well heterostructures

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Cited by 21 publications
(10 citation statements)
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“…On the one hand, by increasing the indium rate from 20% to 60%, the Δ Ec increased from 0.532 to 1.358 eV at room temperature [35]. The increase in indium content improves carrier transport between the InGaN/GaN interfaces because the conduction band offset at the interfaces becomes larger [31]. We notice from Figure 4a that the Fermi energy increases within a temperature range from 300 to 600 K. On the other hand, the Fermi energy decreases due to the increase in the indium rate and the number of wells.…”
Section: Resultsmentioning
confidence: 99%
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“…On the one hand, by increasing the indium rate from 20% to 60%, the Δ Ec increased from 0.532 to 1.358 eV at room temperature [35]. The increase in indium content improves carrier transport between the InGaN/GaN interfaces because the conduction band offset at the interfaces becomes larger [31]. We notice from Figure 4a that the Fermi energy increases within a temperature range from 300 to 600 K. On the other hand, the Fermi energy decreases due to the increase in the indium rate and the number of wells.…”
Section: Resultsmentioning
confidence: 99%
“…The second approach has been adopted by the authors to investigate heat transfer in MOSFET [28,29,30]. It has also been used to investigate an InGaN heterostructures [31].…”
Section: Governing Equations and Numerical Methodsmentioning
confidence: 99%
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