16th International Workshop on Physics of Semiconductor Devices 2012
DOI: 10.1117/12.926781
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Electrical testing of the OLED matrix for analyzing defects in a PMOLED display

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“…After de-bonding, the flexible substrate is bended 1000 times with the radius of 10 cm without any crack. Moreover, Uttwani et al 13 investigated a small OLED matrix by creating defects deliberately to study the possible visual manifestations in a PMOLED display using a cathode ray oscilloscope (CRO).…”
Section: Classification Of Oledmentioning
confidence: 99%
“…After de-bonding, the flexible substrate is bended 1000 times with the radius of 10 cm without any crack. Moreover, Uttwani et al 13 investigated a small OLED matrix by creating defects deliberately to study the possible visual manifestations in a PMOLED display using a cathode ray oscilloscope (CRO).…”
Section: Classification Of Oledmentioning
confidence: 99%
“…However, the lower yield, which is especially due to the processing defects, is still a main concern which adversely affects the OLED display cost [6,7]. During the fabrication and operation of the display panel, different kinds of defects develop, which lead to a defective display with lower luminescence, poor contrast ratio and short panel lifetime [8][9][10][11][12][13][14]. To date, various approaches, such as machine learning [15], cascaded Mura detection [16] and independent component analysis [17], have been employed for their determination and removal from display panels.…”
Section: Introductionmentioning
confidence: 99%