2007
DOI: 10.1109/ted.2006.890377
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Electrical Stress Degradation of Small-Grain Polysilicon Thin-Film Transistors

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Cited by 5 publications
(1 citation statement)
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“…More intriguingly, the In‐surface doped InSe FETs in our work exhibited both ultrahigh mobility and on/off current modulation ratio, of which related statistic results based on the 32 nm thick In InSe FETs could be found in Figure S7 (Supporting Information). It is worth mentioning that our w/In FETs definitely meet the essential requirements for high‐frequency digital or analog electronic applications and exceed the need of the low‐power target for International Technology Roadmap for Semiconductors (ITRS 2.0) in 2021 (see Figure S8 in the Supporting Information) …”
mentioning
confidence: 99%
“…More intriguingly, the In‐surface doped InSe FETs in our work exhibited both ultrahigh mobility and on/off current modulation ratio, of which related statistic results based on the 32 nm thick In InSe FETs could be found in Figure S7 (Supporting Information). It is worth mentioning that our w/In FETs definitely meet the essential requirements for high‐frequency digital or analog electronic applications and exceed the need of the low‐power target for International Technology Roadmap for Semiconductors (ITRS 2.0) in 2021 (see Figure S8 in the Supporting Information) …”
mentioning
confidence: 99%