2004
DOI: 10.1016/j.jcrysgro.2004.01.030
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Electrical properties and ultrafast photo-response of InGaAs/InP grown by low-temperature molecular beam epitaxy with a GaAs decomposition source

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Cited by 10 publications
(4 citation statements)
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References 18 publications
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“…[ 69 ] GaAsBi can overcome the wavelength limitation of LT‐GaAs, without the increase in carrier lifetime and decrease in conductivity observed in InGaAs. [ 74 ]…”
Section: Recent Progress On Gaasbi Devicesmentioning
confidence: 99%
“…[ 69 ] GaAsBi can overcome the wavelength limitation of LT‐GaAs, without the increase in carrier lifetime and decrease in conductivity observed in InGaAs. [ 74 ]…”
Section: Recent Progress On Gaasbi Devicesmentioning
confidence: 99%
“…Especially the LT growth of InGaAs and AlInAs has been under investigation, motivated either by the use in connection with optical fiber systems operating at 1.3 [11] and 1.55 mm [12,13] or by the use as an insulating layer [14,15].…”
Section: Introductionmentioning
confidence: 99%
“…It has been found that the layers grown at the lowest temperatures (180 • C) were characterized by rather short carrier lifetimes of ∼2.3 ps, but had very low resistivity. Doping of LTG In 0.53 Ga 0.47 As with Be has led to some reduction in the free electron density [96,97] (from approximately 2.4 × 10 18 cm −3 to 5×10 16 cm −3 -still too large for applications of this material in photoconductor devices); the carrier lifetime has decreased simultaneously to ∼1.9 ps [98].…”
Section: Materials Sensitive At 1 µM and Longer Wavelengths 341 Ingaasmentioning
confidence: 99%