Electrical, optical and structural studies on nickel phthalocyanine thin films

Unni, K. N. Narayanan; Menon, C. S.

doi:10.1016/s0167-577x(00)00127-0

Cited by 43 publications

(28 citation statements)

References 20 publications

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“…2, thin films deposited at room temperature and annealed at various temperatures are in the α-phase and there is only a significant peak around (2θ¼ 6.91) along the (001) direction which can be identified as the (200) reflection of tetragonal α-NiPc. The results were in good agreement with the previous literature works [25]. It was found that there was a direct correlation between the intensity and sharpening of the predominant peak and annealing temperature.…”

Section: X-ray Diffractionsupporting

confidence: 92%

Investigation of structural and optoelectronic properties of annealed nickel phthalocyanine thin films

Neghabi

Zadsar

Ghorashi

2014

Materials Science in Semiconductor Processing

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Section: X-ray Diffractionsupporting

confidence: 92%

Investigation of structural and optoelectronic properties of annealed nickel phthalocyanine thin films

Neghabi

Zadsar

Ghorashi

2014

Materials Science in Semiconductor Processing

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“…XRD data show that the PdPc structure can be converted from α to β‐phase when they are annealed at temperatures higher than 200°C. The grain size L of the film is calculated using the Scherrer relation where B is a constant equal to 0.9, λ is the wavelength of the used radiation, η 1/2 is the full‐width at half‐maximum intensity and θ is the Bragg angle corresponding to the considered peak.…”

Section: Resultsmentioning

confidence: 99%

Effect of post‐deposition annealing on surface morphology and gas sensing properties of palladium phthalocyanine thin films

Jafari¹,

Azim-Araghi²,

Barhemat³

et al. 2012

Surface & Interface Analysis

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aThe effect of post-deposition annealing on surface morphology and gas sensing properties of palladium phthalocyanine (PdPc) nanostructured thin films has been studied. PdPc thin films were deposited on polyborosilicate substrate by thermal evaporation technique at room temperature. The surface morphology of thin films was investigated by SEM, X-ray diffraction, and optical absorption. X-ray diffraction patterns showed a phase transition from a to b based on post-deposition annealing at temperatures above 200 C. The SEM and optical absorption confirmed that annealing strongly influenced the surface morphology of nanostructured thin films. Sandwich devices (Au|PdPc|Al) were fabricated and exposed to different concentrations of NO 2 and NH 3 as oxidizing and reducing gases at different temperatures, and the sensitivity of devices were obtained versus gases. Obtained results showed a-PdPc thin film devices had higher sensitivity in comparison with devices in b-phase. In particular, it was found that the sensitivity of devices is temperature dependent and the best operating temperature range of devices was measured at about 90-100 C. Devices showed good reversibility, response, and recovery time at room temperature. Finally, the stability of sensors was investigated for a period of about 1 year; results showed that the sensors were stable for 2 months and lost about 30% of their sensitivity after 1 year.

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“…Figure 3a and b show the transmittance and reflectance spectra of the 3-amino-7-dimethylamino-2-methyl phenazine. As seen in figures, the direct electronic transitions from π to π * orbital's in the 300-450 nm range results in an intense band called the Soret band, which gives the absorption edge in 3-amino-7-dimethylamino-2-methyl phenazine (Unni and Menon, 2000). The other band of the NR is the Q-band, which appears in the region between 550 and 750nm.…”

Section: Methodsmentioning

confidence: 97%

Study on Optical Constants and Refractive Index Dispersion of Neutral red Doped Polymer Film

Badran¹

2012

American Journal of Applied Sciences

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Problem statement:The some optical constants polymer thin film with red dye 3-amino-7-dimethylamino-2-methyl phenazine (NR) as the guest material and Polyvinylpyrrolidone (PVP) as the host material were prepared by adulteration and spin-coating methods. Approach: The values of some important parameters (refractive index n, extinction coefficient K and dielectric constant ε ∞ ) of polymer thin film are determined from these spectra. Results: It has been found that the dispersion data obey the single oscillator relation of the Wemple-DiDomenico model, from which the dispersion parameters and high-frequency dielectric constant were determined. The estimation of the E 0 , E d and ε ∞ are 1.27, 3.175 and 3.5 eV respectively. Conclusion: The single oscillator model was used to calculate their optical constants from the transmittance and reflectance spectra. The dispersion of the refractive index in film follow the single electronic oscillator mode relation. The UV-Visible spectroscopic studies showed that, the NR film have high refractive index and high dielectric constant. The variation of the dielectric constant with the wavelength indicates that some interactions between photon and electrons in the films are produced in this wavelength range. These interactions are observed on the shapes of the real and imaginary parts of the dielectric constant and they cause the formation of peaks in the dielectric spectra which depends on the material type.

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Electrical, optical and structural studies on nickel phthalocyanine thin films

Cited by 43 publications

References 20 publications

Investigation of structural and optoelectronic properties of annealed nickel phthalocyanine thin films

Investigation of structural and optoelectronic properties of annealed nickel phthalocyanine thin films

Effect of post‐deposition annealing on surface morphology and gas sensing properties of palladium phthalocyanine thin films

Study on Optical Constants and Refractive Index Dispersion of Neutral red Doped Polymer Film

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