1984
DOI: 10.1063/1.333149
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Electrical observation of the Au-Fe complex in silicon

Abstract: Electron paramagnetic resonance (EPR) and diode capacitance measurements, including deep level transient spectroscopy (DLTS), have been used to identify the levels in the silicon band gap associated with the Au-Fe complex. Two deep levels at Ee -0.354 eV and Ev + 0.434 eV were found with properties consistent with those of the complex; the role of gold in the formation of the complex was confirmed by the observation that during low-temperature annealing ( < 350°C) the changes in the concentration of the center… Show more

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Cited by 54 publications
(21 citation statements)
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“…1 This ionic model has been applied to describe some properties of gold-TM centers. [8][9][10][11][12] According to that description, the observed EPR signals come from a magnetic coupling between the angular momenta of the two isolated ions, one centered on the gold and the other on the TM impurity. Therefore, the notation Au s Ϫ TM i ϩ has been currently used to denote the pairs.…”
Section: Introductionmentioning
confidence: 93%
See 3 more Smart Citations
“…1 This ionic model has been applied to describe some properties of gold-TM centers. [8][9][10][11][12] According to that description, the observed EPR signals come from a magnetic coupling between the angular momenta of the two isolated ions, one centered on the gold and the other on the TM impurity. Therefore, the notation Au s Ϫ TM i ϩ has been currently used to denote the pairs.…”
Section: Introductionmentioning
confidence: 93%
“…EPR technique was used to determine the effective spin and the structure of Au-TM complex defects. 1,[8][9][10][11] Some complexes are associated with electrically active gap levels that have been characterized by diode capacitance measurements, including deep-level transient spectroscopy ͑DLTS͒. 12,13 EPR experiments showed that the pairs are aligned along the ͗111͘ direction with a trigonal symmetry, indicating that they may consist of a substitutional gold with a TM impurity occupying a nearby interstitial site.…”
Section: Introductionmentioning
confidence: 99%
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“…The question whether the solubility of M 1 is affected by a second metal impurity M 2 needs to consider (i) the interaction of the two impurities in silicon and the related changes of their chemical potential there, and (ii) their chemical potentials in ternary liquids or silicides. The former may be neglected at high temperatures since, e.g., the formation of M 1 -M 2 pairs usually occurs at quite low temperature (see, e.g., [34]). The latter is related to the respective ternary (or: multinary) phase diagram.…”
Section: Solubility In Intrinsic Siliconmentioning
confidence: 99%