Electrical Contacts to InP-based Structures with a Zn-doped Subcontact Layer to p-InP

Replacing tunnel junctions in InP with conduction channels with GaP crystallites

“…The EBIC technique provides an opportunity to analyze the electric parameters of structures in the bulk without Ohmic contacts. It should be noted that low-resistance contacts to p-InP [11] are hard to fabricate, and this circumstance affects the CVC measurements. The quality of InP grown on a layer with crystallites was estimated using the photoluminescence method.…”