Electrical-conductivity SFM study of an ultrafiltration membrane

Gallo, P. J.; Kulik, A.; Burnham, Nancy A.; Oulevey, F.; Gremaud, G.

doi:10.1088/0957-4484/8/1/003

Cited by 9 publications

(8 citation statements)

References 9 publications

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“…The conductivity map of the surface, , Figure c, determines unequivocally the precise position and geometry of the electrode in the glass insulator and, moreover, provides evidence that the coated Pt SECM-AFM probe is exposed at the apex of the tip. Cross-section analysis of both Figure a and c, for this particular UME, revealed an electrode of diameter 10.9 μm, with the electrode slightly raised above the surface, to a maximum height of 75 nm, compared to the insulating glass sheath.…”

Section: Resultsmentioning

confidence: 87%

Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy

2001

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Combined scanning electrochemical atomic force microscopy (SECM-AFM) is a recently introduced scanned probe microscopy technique where the probe, which consists of a tip electrode and integrated cantilever, is capable of functioning as both a force sensor, for topographical imaging, and an ultramicroelectrode for electrochemical imaging. To extend the capabilities of the technique, two strategies for noncontact amperometric imaging-in conjunction with contact mode topographical imaging-have been developed for the investigation of solid-liquid interfaces. First, SECM-AFM can be used to image an area of the surface of interest, in contact mode, to deduce the topography. The feedback loop of the AFM is then disengaged and the stepper motor employed to retract the tip a specified distance from the sample, to record a current image over the same area, but with the tip held in a fixed x-y plane above the surface. Second, Lift Mode can be employed, where a line scan of topographical AFM data is first acquired in contact mode, and the line is then rescanned to record SECM current data, with the tip maintained at a constant distance from the target interface, effectively following the contours of the surface. Both approaches are exemplified with SECM feedback and substrate generation-tip collection measurements, with a 10-microm-diameter Pt disk UME serving as a model substrate. The approaches described allow electrochemical images, acquired with the tip above the surface, to be closely correlated with the underlying topography, recorded with the tip in intimate contact with the surface.

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Section: Resultsmentioning

confidence: 87%

Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy

2001

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“…The CAFM measurements have been described elsewhere. 13,14 Briefly, a conducting tip scans at a constant contact force over the surface and acts as an electrode to collect the local current through the probe-ZnO junction. The local current-voltage ͑I-V͒ characteristics reveal that the contact in the EC region behaves as an ohmic contact but that in the boundary region shows a Schottky one.…”

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confidence: 99%

Effect of Threading Dislocations on Local Contacts in Epitaxial ZnO Films

Lin

Liu

Chang

et al. 2010

J. Electrochem. Soc.

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Local conductance of a ZnO epifilm with a columnar-grain structure was studied by conductive-mode atomic force microscopy. The probe-ZnO junction at the grain boundary with high density edge threading dislocations ͑TDs͒ behaves as a Schottky contact while the junction at the epitaxial core behaves as an ohmic contact, resulting in the nonuniformity of conductance throughout the film. The calculated Schottky barrier is 0.4 Ϯ 0.025 eV. The point defects of doubly charged Zn vacancies accumulated at the edge TDs induce local band bending of ZnO, thus contributing to the Schottky nature at the grain boundary.

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“…The filling fraction is comparatively low (between 3 and 12 %), but can be increased using different anodising and metal plating techniques 24,25,26,27,28 . In our calculations we have assumed that for filled pores the metal wires fill the pores completely and therefore have the same diameter as the pores although there is evidence to suggest this is not always the case 29 . The wires show the same atomic structure and the same interatomic distance as the corresponding bulk metal 30 .…”

Section: Nanowire Arraymentioning

confidence: 99%

Nanowire array electrode structure for organic light-emitting diodes.

et al. 2003

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Organic light emitting diodes were fabricated using a novel electrode structure. The anode structure comprised of a metallic nanowire array and was fabricated by electroplating porous aluminium oxide with copper. These devices were compared with devices with a conventional planar anode structure. The light emitting polymer Poly[(4-methylphenyl) imino-4,4'-diphenylene-(4-methylphenyl)imino-1,4-phenylene-ethenylene-2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene-ethenylene-1,4-phenylene)] was used as the emissive material in single layer devices of structure Cu: TPD(4M)-MEH-PPV: Al, where the aluminium was negatively biased with respect to the copper. The DC currentvoltage characteristics of both device types are presented. The electroluminescence spectra are also presented. We found that due to the reduction in active area in the nanowire device from that of the planar device the current density reached in the nanowire array anode device exceeded that in the planar anode device by a factor of eight. Similarly a relative increase in the electroluminescence intensity was also observed.

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Electrical-conductivity SFM study of an ultrafiltration membrane

Cited by 9 publications

References 9 publications

Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy

Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy

Effect of Threading Dislocations on Local Contacts in Epitaxial ZnO Films

Nanowire array electrode structure for organic light-emitting diodes.

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