2001
DOI: 10.1021/ac001072b
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Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy

Abstract: Combined scanning electrochemical atomic force microscopy (SECM-AFM) is a recently introduced scanned probe microscopy technique where the probe, which consists of a tip electrode and integrated cantilever, is capable of functioning as both a force sensor, for topographical imaging, and an ultramicroelectrode for electrochemical imaging. To extend the capabilities of the technique, two strategies for noncontact amperometric imaging-in conjunction with contact mode topographical imaging-have been developed for … Show more

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Cited by 150 publications
(139 citation statements)
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“…In other words, the structural information is simultaneously correlated with chemical activity of the substrate [167]. These hybrid probes are, therefore, quite effective for the identification and chemical mapping of active surface sites [168]. Critical to the resulting synergy of AFM-SECM is the proper modification of the probe.…”
Section: Scanning Probe Microscopy (Spm)mentioning
confidence: 99%
See 1 more Smart Citation
“…In other words, the structural information is simultaneously correlated with chemical activity of the substrate [167]. These hybrid probes are, therefore, quite effective for the identification and chemical mapping of active surface sites [168]. Critical to the resulting synergy of AFM-SECM is the proper modification of the probe.…”
Section: Scanning Probe Microscopy (Spm)mentioning
confidence: 99%
“…Critical to the resulting synergy of AFM-SECM is the proper modification of the probe. Please refer to the reference literature for information on the fabrication and application of various types of AFM-SECM probes [153,154,168]. Gardner et al have studied the correlation of membrane structure and transport activity across a synthetic polyethylene terephthalate (PET) membrane [169].…”
Section: Scanning Probe Microscopy (Spm)mentioning
confidence: 99%
“…The low resonant frequencies of these SECM/ AFM probes require topographical imaging to always be carried out in contact mode ( Figure 1c), but electrochemical imaging can be carried out at either fixed height or constant distance (38) (Figures 1a and 1b, respectively). For fixed-height imaging, the feedback loop is disabled and the stepper motor of the AFM instrument retracts the tip a known distance from the surface of the sample.…”
Section: High-resolution Imaging In Solutionmentioning
confidence: 99%
“…Known as lift mode, this process has previously been used for magnetic and electrostatic AFM imaging. SECM/AFM probes are particularly effective for the identification and chemical mapping of active surface sites, as illustrated in Figure 5b (38). A 10-µm-diam platinum electrode sealed in glass and immersed in an electrolyte solution served as a model active site.…”
Section: High-resolution Imaging In Solutionmentioning
confidence: 99%
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