2002
DOI: 10.1002/1521-396x(200210)193:3<462::aid-pssa462>3.0.co;2-l
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Electrical Conduction in Polycrystalline CVD Diamond: Temperature Dependent Impedance Measurements

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Cited by 21 publications
(10 citation statements)
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“…1) shows only one anomaly for TrHgBrCl 2 . Impedance spectroscopy is able to correlate electrical properties and physical properties using equivalent circuit models on a non-destructive basis: details can be found elsewhere [10,11]. The equivalent elec- trical circuit suggested for the electrochemical cell with tile TrHgBrCl 2 electrode is represented in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…1) shows only one anomaly for TrHgBrCl 2 . Impedance spectroscopy is able to correlate electrical properties and physical properties using equivalent circuit models on a non-destructive basis: details can be found elsewhere [10,11]. The equivalent elec- trical circuit suggested for the electrochemical cell with tile TrHgBrCl 2 electrode is represented in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…It has also been used to characterize the conduction paths in polycrystalline, nanocrystalline diamond films and diamond MOS structures at various biases. [23][24][25][26][27] Here, IS and temperature dependent current-voltage (I-V) technique were used to understand the conduction mechanism and obtain the inherent insight of conductivity transition in O + -implanted UNCD films. This has significance in the preparation of nanocrystalline diamond based devices.…”
mentioning
confidence: 99%
“…17 It has been successfully applied in characterizing the electrical properties of grain interiors as well as the grain boundaries properties of polycrystalline, nanocrystalline diamond, δ-doped diamond and mono-layer nanodiamond. 14, [18][19][20][21] In essence, the IS technique involves the measurement of real and imaginary parts of the complex impedance as a function of frequency.…”
Section: A Impedance Spectroscopymentioning
confidence: 99%
“…(3), when n=3, this equation indicates that there are three conduction mechanisms in the semiconductor material namely: electrode, grain interiors (GI) and grain boundaries (GB). [17][18][19] It was already established in literature that the capacitance associated with grain boundary (C GB ) is 2-3 orders of magnitude higher than the capacitance associated with the grain interior (C GI ). 19,22 The parameters R p and C p were extracted from the fitting equivalent circuit and shown in Table 1.…”
mentioning
confidence: 99%
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