Electrical Characterization of Nanoscale Ferroelectric Structures

About the deformation of ferroelectric hystereses

“…Other setups are based on the measurement of the displacement current via the voltage drop over a known series resistor ("shunt method," 22 Figure 1(b)). State-of-the-art commercially available test systems (e.g., by Aixacct Systems or Radiant Technologies) use an advancement of this idea-the so called "virtual ground method" (Figure 1(c)).…”

“…State-of-the-art commercially available test systems (e.g., by Aixacct Systems or Radiant Technologies) use an advancement of this idea-the so called "virtual ground method" (Figure 1(c)). 1,22 Here, the current is extracted from the voltage drop over the feedback resistor of an inverting operational amplifier. So, the full excitation voltage drops over the ferroelectric.…”

Nanoscale Characterization of Domain Structures in Bi4Ti3O12Single Crystals Using Near-Field Raman Spectroscopy

“…Nanoscale characterization is one of the current topics in the ferroelectric field. 36,37) In particular, recent progress in ferroelectric thin films and devices requires detailed understanding of local ferroelectric properties at the nanoscale level. This has promoted a number of studies on ferroelectric nanostructures [38][39][40][41][42][43][44][45] such as nanodots, nanoislands, and nanowires using various scanning probe microscopy techniques.…”

“…This has promoted a number of studies on ferroelectric nanostructures [38][39][40][41][42][43][44][45] such as nanodots, nanoislands, and nanowires using various scanning probe microscopy techniques. 36) Raman spectroscopy is also potentially useful for the detailed characterization of ferroelectric nanostructures. However, conventional micro-Raman spectroscopy has a spatial resolution of about 500 nm, governed by the diffraction limit.…”

Correspondence - Dynamic leakage current compensation revisited

“…To obtain the polarization P in a current-based method [3], the measured current i must be integrated over time t and divided by the sample area A:…”