1992 Help me understand this report
Electrical Characterization of Epitaxial Titanium Contacts to Alpha (6H) Silicone Carbide
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“…The effect of post annealing of Schottky contacts on the forward current-voltage characteristics has been studied by several groups. Spellman et al 8 reported the effect of annealing conditions on Ti/6H-SiC Schottky diodes. A degradation of characteristics in the linear regime was observed after the first 20-minute annealing in UHV at 700∞C.…”
Section: Introductionmentioning
confidence: 99%
“…The effect of post annealing of Schottky contacts on the forward current-voltage characteristics has been studied by several groups. Spellman et al 8 reported the effect of annealing conditions on Ti/6H-SiC Schottky diodes. A degradation of characteristics in the linear regime was observed after the first 20-minute annealing in UHV at 700∞C.…”
Section: Introductionmentioning
confidence: 99%
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