2012
DOI: 10.1063/1.4747452
|View full text |Cite
|
Sign up to set email alerts
|

Electrical characterization of deoxyribonucleic acid hybridization in metal-oxide-semiconductor-like structures

Abstract: In this work, metal-oxide-semiconductor (MOS)-like sensors in which deoxyribonucleic acid (DNA) strands are covalently immobilized either on Si oxide or on a gold surface were electrically characterized. Si oxide fabrication process allowed us to have a surface insensitive to the solution pH. A significant shift in the flat band voltage was measured after single strand DNA immobilization (+0.47 ± 0.04 V) and after the complementary strand binding (+0.07 ± 0.02 V). The results show that DNA sensing can be perfo… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
4
0

Year Published

2013
2013
2017
2017

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(4 citation statements)
references
References 14 publications
0
4
0
Order By: Relevance
“…The probe-anchored sample was obtained performing the immobilization protocol just described and anchoring single strand DNA as probe. The correct DNA immobilization was verified by different techniques [16,17]. A clear shift of the CV characteristics can be observed, suggesting that the DNA negative charge modifies the V FB value.…”
Section: Electrical Transductionmentioning
confidence: 89%
See 3 more Smart Citations
“…The probe-anchored sample was obtained performing the immobilization protocol just described and anchoring single strand DNA as probe. The correct DNA immobilization was verified by different techniques [16,17]. A clear shift of the CV characteristics can be observed, suggesting that the DNA negative charge modifies the V FB value.…”
Section: Electrical Transductionmentioning
confidence: 89%
“…The strong deviation from the expected results is due to a high concentration of ions (H + , Na + ) that can migrate from the solution to the semiconductor/dielectric interface. A full discussion can be found [16]. Moreover, the data inspection allowed us to observe that the DNA immobilization causes a visible reduction in the C Min value and the DNA layer thickness can be inferred from these measurement following the calculation assuming a dielectric constant for the biological layer of 3 [29].…”
Section: Electrical Transductionmentioning
confidence: 99%
See 2 more Smart Citations