2011
DOI: 10.1016/j.jallcom.2011.07.044
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Electrical characterization of a-Si:H(n)/c-Si(p) structure

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Cited by 9 publications
(3 citation statements)
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References 43 publications
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“…and capacitance-voltage measurements of the resulting diodes. Diode parameters evaluated include the ideality factor, rectification factor, reverse saturation current, and film carrier concentration [26][27][28]…”
Section: Accepted Manuscriptmentioning
confidence: 99%
See 1 more Smart Citation
“…and capacitance-voltage measurements of the resulting diodes. Diode parameters evaluated include the ideality factor, rectification factor, reverse saturation current, and film carrier concentration [26][27][28]…”
Section: Accepted Manuscriptmentioning
confidence: 99%
“…additional mechanism transport, non-ideal contacts behavior, defects on the interfaces or in the bulk increase the ideality factor value [26,27,29]. Therefore, the ideality factor for optimized diodes has to be as close as possible to 1.…”
Section: Accepted Manuscriptmentioning
confidence: 99%
“…Among these junctions, p-n junctions made of oxides are expected to work at a high temperature and cause much attention [1][2][3][4][5]. Reports show that Nb-doped SrTiO 3 single crystal behaves like a metal, suggesting that NSTO is a degenerate n-type semiconductor with a band gap of 3.2 eV [6].…”
Section: Introductionmentioning
confidence: 99%