2014
DOI: 10.1007/s11664-014-3267-2
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Electrical Characteristics of Al/Poly(methyl methacrylate)/p-Si Schottky Device

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Cited by 15 publications
(21 citation statements)
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“…Relevant research has sought to improve OTFT performance in organic and polymeric semiconductors by modifying their chemical structures [912]. Other approaches, such as controlling the deposition of crystalline organic films [13–15] and controlling the nature of the interfaces, have also been developed [16, 17]. …”
Section: Introductionmentioning
confidence: 99%
“…Relevant research has sought to improve OTFT performance in organic and polymeric semiconductors by modifying their chemical structures [912]. Other approaches, such as controlling the deposition of crystalline organic films [13–15] and controlling the nature of the interfaces, have also been developed [16, 17]. …”
Section: Introductionmentioning
confidence: 99%
“…Several studies report on homo-and heterojunction diodes as well as on metal-insulator-semiconductor (MIS) structures having large diode ideality factor, ranging from n¼ 2 to n E2.2, n¼ 3, n ¼4-6.9, n ¼ 3.91 70.11, n ¼5.4770.69, n o5.5, n ¼11.5 [22][23][24][25][26]. Ideality factor of our structures is smaller than ideality factors indicated above references.…”
Section: Resultsmentioning
confidence: 99%
“…Chemical cleaning procedures described previously in detail were applied to the wafer [19,20]. Then it was put inside a vacuum chamber to form a good ohmic contact with a thickness of 1240 Å on unpolished surface using Al (99.999 %).…”
Section: Methodsmentioning
confidence: 99%
“…Imaginary and real parts of dielectric loss and loss tangent are strongly affected by metal or polymers coated on the structures [16][17][18][19]. It is known that PMMA has chemical sensing capability, good insulation properties, high rigidity, transparency, dielectric constant and capability of collection of negative charges.…”
Section: Introductionmentioning
confidence: 99%
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