2011
DOI: 10.1021/nl202160c
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Electrical Breakdown of Nanowires

Abstract: Instantaneous electrical breakdown measurements of GaN and Ag nanowires are performed by an in situ transmission electron microscopy method. Our results directly reveal the mechanism that typical thermally heated semiconductor nanowires break at the midpoint, while metallic nanowires breakdown near the two ends due to the stress induced by electromigration. The different breakdown mechanisms for the nanowires are caused by the different thermal and electrical properties of the materials.

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Cited by 114 publications
(91 citation statements)
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References 24 publications
(39 reference statements)
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“…Scale bar in (a) is 200 nm. Reprinted with permission from [104], copyright 2013 American Chemical Society.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…Scale bar in (a) is 200 nm. Reprinted with permission from [104], copyright 2013 American Chemical Society.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…Undoubtedly, this general knowledge also applies to individual metallic nanowire and the corresponding nanowire mesh, both of which are conductors. Due to the size effects on the nanoscale (e.g., the increase in electrical resistivity [7-9] and the decrease in both thermal conductivity [10-12] and melting point [13,14]), the high current density and the substantial Joule heating induced in metallic nanowires may cause or accelerate electrical failure related to the phenomena of melting [15-17], electromigration [16,18-21], and corrosion [22]. The size effects will definitely also degrade the electrical performance of the corresponding nanowire mesh and therefore reduce the reliability of mesh-based devices.…”
Section: Introductionmentioning
confidence: 99%
“…This is especially important for devices that require high operation current, in which case the film conductivity keeps decreasing until their full breakdown. 250,251 Moreover, some metal NWs (e.g., Ag NWs) can be corroded through chemical reactions, such as oxidation and suffixation, which also cause the degradation of metal NWs and their related devices. …”
mentioning
confidence: 99%