2012
DOI: 10.1016/j.cap.2011.09.002
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Electrical and optical characteristics of porous silicon impregnated with LaF3 by a novel chemical bath technique

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Cited by 8 publications
(2 citation statements)
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“…It is worth noting that the observed rectifying behaviour of these SiNWs is similarly shown in the literature for porous silicon [42,[46][47][48]. Importantly, the nonlinear I-V characteristics and the rectifying event are mainly controlled by the SiNW layers and ascribed to Ag/SiNWs:p-Si since the Si/Al interface was proved to be ohmic [47,48]. The electron flow into the SiNW layers from Ag and recombine with holes, leaving negatively charged electrons in SiNWs which leads to the N-type role of SiNWs with respect to Si.…”
Section: I-v Measurementssupporting
confidence: 80%
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“…It is worth noting that the observed rectifying behaviour of these SiNWs is similarly shown in the literature for porous silicon [42,[46][47][48]. Importantly, the nonlinear I-V characteristics and the rectifying event are mainly controlled by the SiNW layers and ascribed to Ag/SiNWs:p-Si since the Si/Al interface was proved to be ohmic [47,48]. The electron flow into the SiNW layers from Ag and recombine with holes, leaving negatively charged electrons in SiNWs which leads to the N-type role of SiNWs with respect to Si.…”
Section: I-v Measurementssupporting
confidence: 80%
“…One can note that SiNWs fabrication with good uniformity/reproducibility are a MACE feature [4,34]. It is worth noting that the observed rectifying behaviour of these SiNWs is similarly shown in the literature for porous silicon [42,[46][47][48]. Importantly, the nonlinear I-V characteristics and the rectifying event are mainly controlled by the SiNW layers and ascribed to Ag/SiNWs:p-Si since the Si/Al interface was proved to be ohmic [47,48].…”
Section: I-v Measurementssupporting
confidence: 65%