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2021
DOI: 10.1016/j.chaos.2021.111518
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Electrical and optical artificial synapses properties of TiN-nanoparticles incorporated HfAlO-alloy based memristor

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Cited by 9 publications
(7 citation statements)
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“…Although due to higher atomic concentration of Ti from Au/Ti top electrode is dominated, the Ti intensity due to the presence of TiN-NP inside the HfAlO x matrix was suppressed. In the previous work, the Ti presence was clearly demonstrated by the cross-sectional STEM image, core-level XPS spectra of TiN-NP, and elemental profile of Ti across the cross section of ITO/HfAlO x /TiN-NP/HfAlO x /ITO RRAM device [ 24 ]. In the supporting information, to observe the distribution of TiN-NPs surface morphology on the TiN-NP/HfAlO x /ITO structure, scanning electron microscope (SEM) image is presented in Additional file 1 : Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…Although due to higher atomic concentration of Ti from Au/Ti top electrode is dominated, the Ti intensity due to the presence of TiN-NP inside the HfAlO x matrix was suppressed. In the previous work, the Ti presence was clearly demonstrated by the cross-sectional STEM image, core-level XPS spectra of TiN-NP, and elemental profile of Ti across the cross section of ITO/HfAlO x /TiN-NP/HfAlO x /ITO RRAM device [ 24 ]. In the supporting information, to observe the distribution of TiN-NPs surface morphology on the TiN-NP/HfAlO x /ITO structure, scanning electron microscope (SEM) image is presented in Additional file 1 : Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Nearly 5 nm of HfAlO x (TMA 1 + TEMAH 2) was deposited before TiN deposition. HfAlO x alloy ALD deposition details have been given in earlier work [ 24 ]. After deposition of HfAlO x alloy layer, 20 cycles of TiN were deposited with a showerhead plasma-type ALD by titanium tetrachloride (TiCl 4 ) and NH 3 as precursors.…”
Section: Methodsmentioning
confidence: 99%
“…However, for partial two‐ and three‐terminal optical IMCS synapses with semiconductive oxide materials, although low‐dimensional materials were included for functional layers, their all‐in‐one IMCS performance was considered to be associated with the ionized and deionized process of oxygen vacancies induced by external optical stimuli. [ 35,120,121 ] The photoinduced ionization resulted in the neutral oxygen vacancies with a positive charge due to the persistent photoconductivity (PPC) characteristic of the oxide semiconductor and these ionized vacancies transferred back to the neutralized state after removing the optical stimuli. [ 35,120–122 ] The ionized and deionized processes could be represented by the following equations [ 35 ] normalV normalO 0 + O WB 2 + 2 normalh + Ionization normalV normalO 2 + normalO normali + 2 normale normalV normalO 2 + normalO normali + 2 normale + E normala Deionization normalV normalO normalO normali where normalV normalO 0 is the insulating oxygen vacancy without charge, normalO WB 2 is the bound oxygen, normalh + is the hole with a positive charge, normalO normali is the interstitial oxygen, normale is the electron with a negative charge, and E normala is the activation energy.…”
Section: Mechanism Of Optical Imcs Synapses With Low‐dimensional Mate...mentioning
confidence: 99%
“…Mahata et al reported a two‐terminal optical IMCS synapse with 0D TiN‐NPs embedded in the HfAlO switching layer. [ 121 ] With the optoelectric field brought by the optical stimuli, rupture and formation processes of conductive filament (CF)‐based ionized oxygen vacancies were limited by 0D TiN‐NPs. Ionization phenomena of oxygen vacancies occurred near the interface between HfAlO and TiN‐NPs; partial oxygen vacancies with a positive charge formed CFs to connect the top and bottom electrodes of the device, which enhanced the current and modulated the conductance state.…”
Section: Mechanism Of Optical Imcs Synapses With Low‐dimensional Mate...mentioning
confidence: 99%
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