2005
DOI: 10.1016/j.jcrysgro.2005.06.017
|View full text |Cite
|
Sign up to set email alerts
|

Electrical and mechanical properties of tantalum nitride thin films deposited by reactive sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
9
0

Year Published

2006
2006
2022
2022

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 38 publications
(13 citation statements)
references
References 15 publications
1
9
0
Order By: Relevance
“…The semi-quantitative composition (at.%) obtained by the EDS technique was Ta = 18 ± 0.5, Zr = 13.8 ± 0.3, N = 60 ± 0.1, and O = 8.2 ± 0.3. The measured nanohardness (H) at 5 and 10 mN ( Figure 3) was 18.9 ± 1.48 5 mN and 19.7 ± 1.810 mN Gpa, respectively (the penetration depth at 10 mN was less than 15% of the thickness of the layer); this value is within the range (11 to 31 Gpa) reported in the literature [12,26,[30][31][32][33]. The elastic modulus was 189 GPa using 10 mN and 203 ± 12.9 using 5 mN, somewhat lower than that reported for TaZrN [12,27,30] and TaN [26,[32][33][34][35][36] films, as an effect of the Zr concentration in the TaN film [11,30,31,34].…”
Section: Characterization Of Films (Sem Xrd Raman and Corrosion Stsupporting
confidence: 77%
“…The semi-quantitative composition (at.%) obtained by the EDS technique was Ta = 18 ± 0.5, Zr = 13.8 ± 0.3, N = 60 ± 0.1, and O = 8.2 ± 0.3. The measured nanohardness (H) at 5 and 10 mN ( Figure 3) was 18.9 ± 1.48 5 mN and 19.7 ± 1.810 mN Gpa, respectively (the penetration depth at 10 mN was less than 15% of the thickness of the layer); this value is within the range (11 to 31 Gpa) reported in the literature [12,26,[30][31][32][33]. The elastic modulus was 189 GPa using 10 mN and 203 ± 12.9 using 5 mN, somewhat lower than that reported for TaZrN [12,27,30] and TaN [26,[32][33][34][35][36] films, as an effect of the Zr concentration in the TaN film [11,30,31,34].…”
Section: Characterization Of Films (Sem Xrd Raman and Corrosion Stsupporting
confidence: 77%
“…To transfer excited electrons from the BaTaO 2 N phase to the Ta substrate, the conductivity of the intermediate Ta 2 N layer is important, and the conductivity of Ta–N compounds increases with decreasing N/Ta ratio, as the material transitions from semiconducting to semimetallic. Ta 2 N has the lowest N/Ta ratio and its conductivity is remarkably high . Thus, the presence of this compound between the BaTaO 2 N and Ta layers did not obstruct electron transfer.…”
Section: Resultsmentioning
confidence: 96%
“…An important implication of this result is that new materials originally produced by synthesis under high-P,T conditions may go on to be achieved metastably at low pressure in technologically useful forms such as thin films [35]. Niobium nitrides with N-rich compositions up to Nb 3 N 4 have been produced by pulsed laser deposition of Nb in N 2 /H 2 mixtures [36], Ta 3 N 5 films have been obtained by various PVD methods [37,38] and Ta 4 N 5 has been obtained by reactive sputtering (Table 1) [39].…”
Section: Ambient and Low Pressure Synthesis Approachesmentioning
confidence: 99%