1971
DOI: 10.1103/physrevb.4.974
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Electric Field Distriutions in Dielectrics, with Special Emphasis on Near-Surface Regions in Ferroelectrics

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Cited by 49 publications
(4 citation statements)
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“…Similarly, a strained piezoelectric material can also produce a permanent polarization that induces a remnant piezopotential at the piezoelectric material‐electrode interface under a short‐circuit condition. This phenomenon can be understood via the same model used for ferroelectric materials 20, 25, 26…”
Section: Remnant Polarization In Strained Piezoelectric Materialsmentioning
confidence: 98%
“…Similarly, a strained piezoelectric material can also produce a permanent polarization that induces a remnant piezopotential at the piezoelectric material‐electrode interface under a short‐circuit condition. This phenomenon can be understood via the same model used for ferroelectric materials 20, 25, 26…”
Section: Remnant Polarization In Strained Piezoelectric Materialsmentioning
confidence: 98%
“…These assumptions imply a strong enhancement of the dielectric function below the frequency, corresponding to the typical inverse response time of the space-charge layer, say 0.1 Hz. differential equations (1) to (3) seem to exist except3 for p o = 0. Since specific numerical problems arise No analytical or numerical solutions to the set of centre, because the roundoff errors get too large.…”
Section: Computer Simulationmentioning
confidence: 96%
“…* In either case, the dynamics of space charge' is governed by equilibrium between diffusion and drift at temperature T, Poisson's equation for the derivative of the polarization P with respect to the thickness coordinate z of a thin plate, reads for certain ranges of p~ and E , the procedure for solving (1) to (3) is outlined.…”
mentioning
confidence: 99%
“…Les distributions de porteurs, de champ et de potentiel ont été déterminées par des méthodes analytiques [7][8][9][10][11][12][13] ou numériques [14][15][16][17][18][19]. La plupart de ces travaux, soit en raison de certaines approximations, soit en raison d'une spécificité d'application n'ont pas permis de dégager des expressions analytiques des densités de porteurs et du champ électrique dans le cas général.…”
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