2020
DOI: 10.1016/j.solener.2020.04.027
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Efficient visible-light-driven water splitting performance of sulfidation-free, solution processed Cu2MgSnS4 thin films: Role of post-drying temperature

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Cited by 17 publications
(7 citation statements)
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“…The strongest peak for all patterns is found at ~ 28.54 o , which is referred to the (112) plane. The XRD results at this direction are depicted in Table (1). The intensity of all peaks increases as the ratio of thiourea increases.…”
Section: Results Of Xrdmentioning
confidence: 98%
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“…The strongest peak for all patterns is found at ~ 28.54 o , which is referred to the (112) plane. The XRD results at this direction are depicted in Table (1). The intensity of all peaks increases as the ratio of thiourea increases.…”
Section: Results Of Xrdmentioning
confidence: 98%
“…XRD patterns of Cu 2 MgSnS 4 (CMTS) thin films deposited at different thiourea concentrations of 0.14, 0.16, 0.18, 0.20, 0.22, and 0.24 M are shown in figure (1). Five clear diffraction peaks appeared in the XRD patterns of the films deposited at thiourea concentrations of 0.18 M and 0.20 M at 2θ ~ 18.28 o , 28.54 o , 32.9 o , 47.43 o and 56.18 o which correspond to the (002), (112), (200), ( 220) and (312) planes respectively which match well with the data of JCPDS card number (98-017-1983) confirming the formation of tetragonal structure and distinguished by high crystallinity from the rest of the films.…”
Section: Results Of Xrdmentioning
confidence: 99%
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