“…XRD patterns of Cu 2 MgSnS 4 (CMTS) thin films deposited at different thiourea concentrations of 0.14, 0.16, 0.18, 0.20, 0.22, and 0.24 M are shown in figure (1). Five clear diffraction peaks appeared in the XRD patterns of the films deposited at thiourea concentrations of 0.18 M and 0.20 M at 2θ ~ 18.28 o , 28.54 o , 32.9 o , 47.43 o and 56.18 o which correspond to the (002), (112), (200), ( 220) and (312) planes respectively which match well with the data of JCPDS card number (98-017-1983) confirming the formation of tetragonal structure and distinguished by high crystallinity from the rest of the films.…”