Efficient test generation for transient testing of analog circuits using partial numerical simulation

Variyam, P.N.; Hou, Junwei; Chatterjee, Anirban

doi:10.1109/vtest.1999.766668

Cited by 11 publications

(3 citation statements)

References 20 publications

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“…Time domain analysis is performed. Piece-wise linear (PWL) transient signal [11,12] is applied to the CUT with use of an arbitrary waveform generator. Exemplary PWL signal is shown in Fig.…”

Section: Proposed Approachmentioning

confidence: 99%

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Two-center Radial Basis Function Network For Classification of Soft Faults in Electronic Analog Circuits

Kowalewski

2007

2007 IEEE Instrumentation &Amp; Measurement Technology Conference IMTC 2007

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In this paper, a new neural network architecture with two-center radial basis functions (TCRB functions, TCRBF) in the hidden layer was presented. The special shape of TCRB function was introduced to enhance the efficiency of soft faults classification in electronic analog circuits. The application of TCRB functions in neural network classifier gives possibility to reduce the number ofneurons in its hidden layer in comparison to radial basis function network with Gaussian basis functions. Additionally there is an improvement in testability of circuit under test (CUT) through decreasing the classification error. This article shows results obtainedfor lowpass 2th orderfilter.

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Section: Proposed Approachmentioning

confidence: 99%

“…Faults classification methods of complex analog circuits are usually based on Simulation Before Test (SBT) methodology [1][2][3][4][5][6][7][8][9][10][11][12][13]. The more probable faults of the CUT are simulated with a pre-defined input stimulus applied to the circuit input.…”

Section: Introductionmentioning

confidence: 99%

Two-center Radial Basis Function Network For Classification of Soft Faults in Electronic Analog Circuits

Kowalewski

2007

2007 IEEE Instrumentation &Amp; Measurement Technology Conference IMTC 2007

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“…In transient testing (Gomes and Chatterjee, 1999;Variyam et al, 1999;Burdiek, 2001), the circuit under test (CUT) is excited with a transient test stimulus and the circuit response is sampled at specified time points for fault detection. In this paper a new test signal generation method based on control theory techniques like Pontryagin's maximum principle is presented.…”

Section: Introductionmentioning

confidence: 99%

Test signal generation for analog circuits

Burdiek

Mathis

2003

Adv. Radio Sci.

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Abstract. In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation problem of finding optimal test stimuli detecting all faults form the fault set is formulated as an optimal control problem. The solution of the optimal control problem representing the test stimuli is computed using an optimization procedure. The optimization procedure is based on the necessary conditions for optimality like the maximum principle of Pontryagin and adjoint circuit equations.

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A novel test compression algorithm for analog circuits to decrease production costs

2017

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Efficient test generation for transient testing of analog circuits using partial numerical simulation

Cited by 11 publications

References 20 publications

Two-center Radial Basis Function Network For Classification of Soft Faults in Electronic Analog Circuits

Two-center Radial Basis Function Network For Classification of Soft Faults in Electronic Analog Circuits

Test signal generation for analog circuits

A novel test compression algorithm for analog circuits to decrease production costs

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