Efficient static compaction of test sequence sets through the application of set covering techniques

Dimopoulos, Michael G.; Linardis, Panagiotis

doi:10.1109/date.2004.1268848

Cited by 20 publications

(7 citation statements)

References 18 publications

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“…Changing the sequence of test vectors by means of test vector reordering could potentially increase the number of detected faults and further reduce the size of the test set [Pomeranz and Reddy 2001]. Set covering [Drineas and Makris 2003] and integer linear programming [Dimopoulos and Linardis 2004] have also been explored for compacting tests statically.…”

Section: Related Workmentioning

confidence: 99%

Test compaction techniques for assertion-based test generation

Tong

Boulé

Žilić

2013

ACM Trans. Des. Autom. Electron. Syst.

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Assertions are now widely used in verification as a means to help convey designer intent and also to simplify the detection of erroneous conditions by the firing of assertions. With this expressive modeling power, assertions could also be used for tasks such as helping to assess test coverage and even as a source for test generation. Our work deals with this last aspect, namely, assertion-based test generation. In this article, we present our compacted test generation scheme based on assertions. Novel compaction techniques are presented based on assertion clustering, test-path overlap detection and parallel-path removal. Our compaction approach is experimentally evaluated using nearly 300 assertions to show the amount of reduction that can be obtained in the size of the test sets. This ultimately has a positive impact on verification time in the quest for bugfree designs.

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Section: Related Workmentioning

confidence: 99%

Test compaction techniques for assertion-based test generation

Tong

Boulé

Žilić

2013

ACM Trans. Des. Autom. Electron. Syst.

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show abstract

“…Redundant test elimination can be modeled as a set covering problem to cover all target faults using the minimum number of test vectors. Dimopoulos and Linardis [7] have modeled static compaction for sequential circuits as a set-covering problem. Set covering has also been applied to combinational circuits using the fault detection matrix [10,14].…”

Section: Test Compactionmentioning

confidence: 99%

Functional Test Compaction

Chen

Qin

Koo³

et al. 2012

System-Level Validation

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“…Test compaction for benchmark circuits is the process of reducing the size of a test pattern or the total size of the test pattern set for the circuit. Since reducing the volume of the test data is an important process, several test compaction methods, static or dynamic, have been proposed [2,[6][7][8][9] . As one of the test compaction categories, static test compaction does not require any modification to the test generation procedure and is independent of the test generation process.…”

Section: Introductionmentioning

confidence: 99%

“…In Ref. [7], the set covering technique was effectively used to model the test sequence compaction problem as a set covering formulation, and very good compaction ratios were achieved.…”

Section: Introductionmentioning

confidence: 99%

Efficient static compaction of test patterns using partial maximum satisfiability

Zhou

Ouyang

Zhang

2021

Tinshhua Sci. Technol.

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Static compaction methods aim at finding unnecessary test patterns to reduce the size of the test set as a post-process of test generation. Techniques based on partial maximum satisfiability are often used to track many hard problems in various domains, including artificial intelligence, computational biology, data mining, and machine learning. We observe that part of the test patterns generated by the commercial Automatic Test Pattern Generation (ATPG) tool is redundant, and the relationship between test patterns and faults, as a significant information, can effectively induce the test patterns reduction process. Considering a test pattern can detect one or more faults, we map the problem of static test compaction to a partial maximum satisfiability problem. Experiments on ISCAS89, ISCAS85, and ITC99 benchmarks show that this approach can reduce the initial test set size generated by TetraMAX18 while maintaining fault coverage.

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Efficient static compaction of test sequence sets through the application of set covering techniques

Cited by 20 publications

References 18 publications

Test compaction techniques for assertion-based test generation

Test compaction techniques for assertion-based test generation

Functional Test Compaction

Efficient static compaction of test patterns using partial maximum satisfiability

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