2007
DOI: 10.1016/j.jpcs.2007.01.014
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Efficient diffractive optical elements in chalcogenide glass layers fabricated by direct DUV laser writing

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Cited by 15 publications
(5 citation statements)
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“…The spatial resolution of the process of creating micro-optical elements using DLW is primarily determined by the spot size of the focused laser beam. This subsequently depends on the wavelength and characteristics of the recording materials, an on the accuracy of the two-coordinate positioning systems used in the recording process [7].…”
Section: Direct Laser Writing Of Phase Optical Elementsmentioning
confidence: 99%
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“…The spatial resolution of the process of creating micro-optical elements using DLW is primarily determined by the spot size of the focused laser beam. This subsequently depends on the wavelength and characteristics of the recording materials, an on the accuracy of the two-coordinate positioning systems used in the recording process [7].…”
Section: Direct Laser Writing Of Phase Optical Elementsmentioning
confidence: 99%
“…Unlike conventional high refractive index glasses, chalcogenide glasses can undergo distinct radiation-induced structural modifications, at comparatively low power densities and exposure doses [7]. Chalcogenide glasses have gained extensive interest, not only because of their high refractive index, wide transparent window, and high optical nonlinearity, but also for their rich physicochemical properties, such as phase changing and photopolymerization, upon light exposure [17,18].…”
Section: The Formation Of Nanosized Relief On Chalcogenide Semiconductors By a Laser Beam Recorder Of Master Discsmentioning
confidence: 99%
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“…One important aspect of the fabrication of many optical devices is surface pattering with miniaturized functional structures, for example, waveguides, resonators, or diffraction grating. To pattern chalcogenide glasses for device fabrication, direct writing with an electron beam or with a laser has been broadly used . However, beam writing, which is a serial process, has a very low throughput, and is thus suitable for prototyping rather than for scalable fabrication of devices.…”
Section: Calculated and Measured Angles For Reflection Diffraction Grmentioning
confidence: 99%