2017
DOI: 10.1186/s11671-017-2087-8
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Efficient Carrier Injection, Transport, Relaxation, and Recombination Associated with a Stronger Carrier Localization and a Low Polarization Effect of Nonpolar m-plane InGaN/GaN Light-Emitting Diodes

Abstract: Based on time-resolved electroluminescence (TREL) measurement, more efficient carrier injection, transport, relaxation, and recombination associated with a stronger carrier localization and a low polarization effect in a nonpolar m-plane InGaN/GaN light emitting diode (m-LED), compared with those in a polar c-LED, are reported. With a higher applied voltage in the c-LED, decreasing response time and rising time improve device performance, but a longer recombination time degrades luminescence efficiency. By usi… Show more

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Cited by 8 publications
(6 citation statements)
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“…The injection, transport, and accumulation of charge carriers under varying applied voltages in the NIR PeLEDs were analyzed by the C − V characteristics of the devices. 38–40 For convenience, we chose three distinct devices to analyze the C – V characteristics at a fixed frequency of 1 KHz in the dark condition, as shown in Fig. 3.…”
Section: Resultsmentioning
confidence: 99%
“…The injection, transport, and accumulation of charge carriers under varying applied voltages in the NIR PeLEDs were analyzed by the C − V characteristics of the devices. 38–40 For convenience, we chose three distinct devices to analyze the C – V characteristics at a fixed frequency of 1 KHz in the dark condition, as shown in Fig. 3.…”
Section: Resultsmentioning
confidence: 99%
“…We observed a continuous increase in capacitance at moderate applied voltages (second regime), indicating suppression of depletion regions due to charge injection and accumulation. The 1MA-based NIR PeLEDs, in particular, rises faster than the other three devices, which is most likely due to more and more carriers being injected in the device, and a higher number of injected carriers leads to a faster rise rate [ 56 , 57 , 58 ]. Because electron injection in NIR PeLEDs uses the same device structure Liq/CN-T2T/Liq/Al, the faster rise of the 1MA device curve can only be explained by enhanced hole injection that resulted in balanced charge injection into EML.…”
Section: Resultsmentioning
confidence: 99%
“…The overall resolution of TREL system is less than 2 ns. The detailed measurement was described in our previous study 18,19 .…”
Section: Methodsmentioning
confidence: 99%
“…Although device performance of GaN-based LEDs with graphene transparent conductive electrodes has been shown to be improved, these measurements cannot quantitatively describe carrier dynamic behaviors. Time-resolved electroluminescence (TREL) measurement under electrical fast pulse excitation is a power tool to explore the dynamic EL behaviors of carrier injection, carrier transport, carrier relaxation into active region, and carrier recombination at the excited states in active region of LEDs 18,19 . From the results of TREL measurements, nitrogen-polar InGaN/ GaN LEDs with the opposite polarity and nonpolar m-plane InGaN/GaN LEDs with a low polarization effect were shown to provide the advantages of more carrier injection, transport, relaxation, and recombination 18,19 .…”
mentioning
confidence: 99%
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