Effects of X-rays on Perovskite Solar Cells

Stückelberger, Michael; Nietzold, Tara; West, Bradley; Luo, Yanqi; Li, Xueying; Werner, Jérémie; Niesen, Björn; Ballif, Christophe; Rose, Volker; Fenning, David P.; Bertoni, Mariana I.

doi:10.1021/acs.jpcc.0c04645

Cited by 26 publications

(26 citation statements)

References 44 publications

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“…40 After accounting for partial X-ray transmission through the nanometric perovskite film, the nano-focused X-ray irradiation is equivalent to ~700 suns, providing an accelerated test condition to monitor the stability and degradation of the perovskite crystal in the presence of a large concentration of carriers. 41 To analyze any structural degradation, a correlation coefficient of the diffraction pattern at each frame with respect to the initial one was calculated as a representation of structural degradation of perovskite, according to:…”

Section: Methodsmentioning

confidence: 99%

Residual Nanoscale Strain in Cesium Lead Bromide Perovskite Reduces Stability and Shifts Local Luminescence

Li¹,

Luo²,

Holt

et al. 2019

Chem. Mater.

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Using nanoprobe X-ray diffraction microscopy, we investigate the relationship between residual strains from crystal growth in CsPbBr3 thin film crystals, their stability, and local bandgap. We find that out-of-plane compressive strain that arises from cooldown from crystallization is detrimental to material stability under X-ray irradiation. We also find that the optical photoluminescence red shifts as a result of the out-of-plane compressive strain. The sensitivity of bandgap to strain suggests possible applications such as stress-sensitive sensors.Mosaicity, the formation of small misorientations in neighboring crystalline domains we observe in some CsPbBr3 single crystals, indicates the significant variations in crystal quality that can occur even in single-crystal halide perovskites. The nano-diffraction results suggest that reducing local strains is a necessary path to enhance the stability of perovskite optoelectronic materials and devices from light-emitting diodes to high-energy detectors.

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Section: Methodsmentioning

confidence: 99%

Residual Nanoscale Strain in Cesium Lead Bromide Perovskite Reduces Stability and Shifts Local Luminescence

Li¹,

Luo²,

Holt

et al. 2019

Chem. Mater.

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“…XBIC: For XBIC measurements, requirements are relaxed as long as a chopper is used to modulate the X-ray beam. Dedicated XBIC scans could be performed more than an order of magnitude faster with comparable signal-to-noise; the long dwell time required for the multi-modal measurement would only be a drawback if X-ray beam-induced sample damage was present, as is the case, e.g., in perovskite solar cells [ 20 , 41 ].…”

Section: Materials and Methodsmentioning

confidence: 99%

“…X-ray beam-induced current (XBIC): The absorption of an X-ray photon in the absorber layer of the solar cell leads to a particle shower of electrons and photons and, after thermalization, to multiple excited electron-hole pairs at the band edges (simulations of this process are detailed in the supplementary information (SI) of Reference [ 20 ]). Same as upon excitation by photons in the visible range, the electrons and holes can be separated within the solar cell and collected at the solar-cell contacts.…”

Section: Introductionmentioning

confidence: 99%

Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se2 Solar Cell

et al. 2021

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Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structure, and performance in four-fold multi-modality. Using scanning X-ray microscopy of a Cu(In,Ga)Se2 (CIGS) solar cell, we measured the elemental distribution of the key absorber elements, the electrical and optical response, and the phase shift of the coherent X-rays with nanoscale resolution. We found structural features in the absorber layer—interpreted as voids—that correlate with poor electrical performance and point towards defects that limit the overall solar cell efficiency.

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“…Furthermore, Stuckelberger et al carried out nano-XRF with X-ray beam-induced current (XBIC) on mesoscopic MAPbI 3 solar cells. The combined XRF/XBIC measurements give valuable correlation between elemental distributions and charge collection efficiency 16 . Philippe et al 17 demonstrated the depth-dependent distribution of Cs and Rb and the role of the distributions in mixed-cation RbCsMAFA perovskite with hard X-ray photoelectron spectroscopy (HAXPES).…”

Section: Introductionmentioning

confidence: 99%

Soft X-ray characterization of halide perovskite film by scanning transmission X-ray microscopy

Jun

Lee

Tondelier

et al. 2022

Sci Rep

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Organic–inorganic metal halide perovskites (MHPs) have recently been receiving a lot of attention due to their newfound application in optoelectronic devices, including perovskite solar cells (PSCs) which have reached power conversion efficiencies as high as 25.5%. However, the fundamental mechanisms in PSCs, including the correlation of degradation with the excellent optoelectrical properties of the perovskite absorbers, are poorly understood. In this paper, we have explored synchrotron-based soft X-ray characterization as an effective technique for the compositional analysis of MHP thin films. Most synchrotron-based studies used for investigating MHPs so far are based on hard X-rays (5–10 keV) which include various absorption edges (Pb L-edge, I L-edge, Br K-edge, etc.) but are not suited for the analysis of the organic component in these materials. In order to be sensitive to a maximum number of elements, we have employed soft X-ray-based scanning transmission X-ray microscopy (STXM) as a spectro-microscopy technique for the characterization of MHPs. We examined its sensitivity to iodine and organic components, aging, or oxidation by-products in MHPs to make sure that our suggested method is suitable for studying MHPs. Furthermore, methylammonium triiodide with different deposition ratios of PbI2 and CH3NH3I (MAI), and different thicknesses, were characterized for chemical inhomogeneity at the nanoscale by STXM. Through these measurements, we demonstrate that STXM is very sensitive to chemical composition and homogeneity in MHPs. Thus, we highlight the utility of STXM for an in-depth analysis of physical and chemical phenomena in PSCs.

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Effects of X-rays on Perovskite Solar Cells

Cited by 26 publications

References 44 publications

Residual Nanoscale Strain in Cesium Lead Bromide Perovskite Reduces Stability and Shifts Local Luminescence

Residual Nanoscale Strain in Cesium Lead Bromide Perovskite Reduces Stability and Shifts Local Luminescence

Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se2 Solar Cell

Soft X-ray characterization of halide perovskite film by scanning transmission X-ray microscopy

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