“…In references [3,[5][6][7][8][9][10][11][12][13][14] it is assumed that a rupture pins the anode stress at rup . Should that happen the void will continue to grow until the flux leaking into the dielectric stack can be brought to a halt; this can only In references [11,13,14] only void growth is considered, although a critical value of the jL product (implying nucleation or rupture) is sought rather than jL 2 , which is relevant to void growth [2]. References [5][6][7][8] define a probability of line failure, after the line ruptures and in the passivated case, as the ratio of two non-zero steady-state drift velocities,…”