“…Following Read, several researchers have investigated both the DC and RF characteristics of IMPATT devices taking into account the tunnelling generation along with the avalanche generation within the device (Kwok & Haddad, 1972;Chive, Constant, Lefebvre, & Pribetich, 1975;Elta & Haddad, 1978, 1979a, 1979bLuy & Kuehnf, 1989). A comprehensive technique to simulate the static (DC) and small-signal (S-S) characteristics of IMPATT devices based on driftdiffusion model was first reported by Roy et al in the years 1979and 1985, respectively (Roy, Banerjee, & Pati, 1985Roy, Sridharan, Ghosh, & Pal, 1979).…”