Effects of magnetic layer thickness on negative nucleation field and Cr segregation behavior in CoCrPt/Ti perpendicular media

Microstructural evolution and magnetization reversal mechanism of CoPt films with perpendicular magnetic anisotropy

“…This could be attributed to the isolated grains in the later stage of film growth as observed from planview and cross-section TEM images in figures 2(b) and 3(b), respectively. The observed domain pattern was consistent with the result reported by Lee et al [16]. With a further increase in the thickness to 80 nm, the dot-like pattern remained but its size increased to 350 nm (figure 7(c)).…”

Focused ion beam deposition of Co71Cr17Pt12and Ni80Fe20on tips for magnetic force microscopy

“…For the 2 min Co 71 Cr 17 Pt 12 deposit we observed f 1 = 42 927 Hz and f 2 = 42 829 Hz, which gives m 1 = 4.128 × 10 −11 kg and m 2 = 4.147 × 10 −11 kg, yielding a thickness estimate of about 10 nm, which is sufficient to produce magnetic properties in this material [13,14]. While this is too thin to be detected by EDS or standard optical techniques, it is sufficient to produce excellent MFM images, as shown in figure 5.…”