2019
DOI: 10.1103/physrevmaterials.3.064413
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Effects of field annealing on MnN/CoFeB exchange bias systems

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Cited by 6 publications
(9 citation statements)
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“…In this study, the median lateral grain size of the MnN was found to be 4.8 nm and the anisotropy constant at room temperature was estimated as K AF 6 × 10 5 J/m 3 . In polarized neutron reflectometry measurements, the films were found to be slightly rich in nitrogen and no magnetic scattering from the MnN films could be detected [27]. This excludes the possibility, that electrical switching of ferrimagnetic Mn 4 N precipitates contributes to the signals we investigate in the present study.…”
Section: Methodsmentioning
confidence: 62%
See 1 more Smart Citation
“…In this study, the median lateral grain size of the MnN was found to be 4.8 nm and the anisotropy constant at room temperature was estimated as K AF 6 × 10 5 J/m 3 . In polarized neutron reflectometry measurements, the films were found to be slightly rich in nitrogen and no magnetic scattering from the MnN films could be detected [27]. This excludes the possibility, that electrical switching of ferrimagnetic Mn 4 N precipitates contributes to the signals we investigate in the present study.…”
Section: Methodsmentioning
confidence: 62%
“…However, the spin orientation is controversial and might depend critically on the lattice constants. In previous studies, some of the authors of this article have shown its utility for exchange bias applications with large exchange bias fields at room temperature [22][23][24][25][26][27]. However, the critical thickness for the onset of exchange bias was observed to be around 10 nm at room temperature, leading to the conclusion that MnN has a small magnetocrystalline anisotropy energy density [22].…”
Section: Introductionmentioning
confidence: 91%
“…The effects of field annealing were further investigated as a function of the thickness of the MnN layer and the field annealing temperature in Ta/MnN/CoFeB exchange-bias systems in a more recent paper [18]. It was found that for thick (48 nm) MnN films, the exchange bias increased due to an improvement in the crystallinity of the films.…”
Section: Exchange Bias: In-plane Studiesmentioning
confidence: 99%
“…Recent polarized neutron reflectometry [20] and Auger electron depth profile [12] studies of Ta 10 nm/ MnN 30 nm/ CoFeB 1.6 nm stacks revealed the crucial role of the Ta buffer layer on which MnN is grown for better crystallinity. By investigating the samples directly after preparation as well as after annealing, it was found that the nitrogen diffuses from MnN into the Ta buffer layer during the annealing process.…”
Section: Introductionmentioning
confidence: 99%
“…After annealing at high temperatures of T A > 500 • C, the Ta layer is fully saturated with nitrogen. It was proposed that, in terms of better thermal stability, using a thinner Ta buffer layer could be beneficial [20]. The thinner the Ta, the less nitrogen needs to diffuse from the MnN to the Ta layer for the latter to be saturated.…”
Section: Introductionmentioning
confidence: 99%