2008
DOI: 10.1016/j.optlastec.2007.04.011
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Effects of deposition temperature on the structural and morphological properties of thin ZnO films fabricated by pulsed laser deposition

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Cited by 28 publications
(9 citation statements)
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“…Thus, we also performed X-ray diffraction measurement under Θ-2Θ-geometry (Fig. 3b); they show the "tendency" of the grown film to the (002)-orientation which is in good agreement with the results in the literature [26][27][28].…”
Section: Film Structure and Surface Morphologysupporting
confidence: 88%
“…Thus, we also performed X-ray diffraction measurement under Θ-2Θ-geometry (Fig. 3b); they show the "tendency" of the grown film to the (002)-orientation which is in good agreement with the results in the literature [26][27][28].…”
Section: Film Structure and Surface Morphologysupporting
confidence: 88%
“…These observations suggest that there could be an optimum range of substrate temperature to obtain the best surface quality. This is in agreement with the results of other studies [18][19][20]. For example, Liu et al [21] observed similar phenomena for ZnO coatings obtained by the PLD method.…”
Section: Methodssupporting
confidence: 92%
“…Overall, it is found that polycrystalline films are grown; the ZnO (002) and ZnO (103) diffractions peaks are observed in all patterns at 34.45° and 62.9°, respectively. The same diffraction peaks were observed in the work of R. Khandelwal et all [9]. However, several of the zinc oxide reflections are missing, indicating a preferred orientation of the films.…”
Section: Resultssupporting
confidence: 82%