2013
DOI: 10.1016/j.apsusc.2012.10.057
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Effects of CdZnTe buffer layer thickness on properties of HgCdTe thin film grown by pulsed laser deposition

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Cited by 9 publications
(1 citation statement)
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“…According to [19,20], Te 3d5/2 peaks of CdZnTe films (in figure 6) can provide effective energy state information to analyze the types and contents of defects on the surface of films. Te 3d5/2 peaks, indicating the energy of Te 2− ions in CdZnTe films [21,22], are labeled as Te tot and fitted using Gaussian (70%)-Lorentzian (30%) function [23]. The peaks of the binding energy near 572 eV are marked as Te czt , indicating the energy state of Te 2− ions in a CdZnTe perfect lattice.…”
Section: Gan/znte/cdznte Multilayer Filmsmentioning
confidence: 99%
“…According to [19,20], Te 3d5/2 peaks of CdZnTe films (in figure 6) can provide effective energy state information to analyze the types and contents of defects on the surface of films. Te 3d5/2 peaks, indicating the energy of Te 2− ions in CdZnTe films [21,22], are labeled as Te tot and fitted using Gaussian (70%)-Lorentzian (30%) function [23]. The peaks of the binding energy near 572 eV are marked as Te czt , indicating the energy state of Te 2− ions in a CdZnTe perfect lattice.…”
Section: Gan/znte/cdznte Multilayer Filmsmentioning
confidence: 99%