2010
DOI: 10.1063/1.3327831
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Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

Abstract: Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy ͑V-PFM͒ imaging of polarization domains in thin-film based ͑001͒-oriented BiFeO 3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PF… Show more

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Cited by 60 publications
(41 citation statements)
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References 15 publications
(15 reference statements)
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“…Since the polarization is almost exclusively in-plane oriented in most of the images, the vertical PFM images give mainly contrast along the [010] axis (due to the cantilever buckling effect). [31][32][33] Compar- ison of lateral and vertical mode images taken in the same area clearly confirms presence of about 0.5-1 micron size "coarse domains" formed by regular nanodomain a/a/a/a twinned areas with about 20 nm wide a-domain stripes with polarization oriented alternatively along…”
Section: Resultsmentioning
confidence: 77%
“…Since the polarization is almost exclusively in-plane oriented in most of the images, the vertical PFM images give mainly contrast along the [010] axis (due to the cantilever buckling effect). [31][32][33] Compar- ison of lateral and vertical mode images taken in the same area clearly confirms presence of about 0.5-1 micron size "coarse domains" formed by regular nanodomain a/a/a/a twinned areas with about 20 nm wide a-domain stripes with polarization oriented alternatively along…”
Section: Resultsmentioning
confidence: 77%
“…124 Furthermore, buckling contributions to the VPFM signal as well as topographical cross-talk strongly encourage the practice of angle-resolved PFM to discriminate true contributions of the ferroelectric polarisation. 60,125 An LPFM signal that is piezoelectric in nature can however be observed in samples devoid of in-plane polarisation, at the position of 180 • domain walls, as shown in Fig. 3.…”
Section: Ferroelectric Nanoscale Imagingmentioning
confidence: 99%
“…However, despite the need to understand polarization orientations, experimental methods to resolve the inplane and out-of-plane polarization in ferroelectric or multiferroic thin films are not well established. Piezoresponse force microscopy (PFM) measures electromechanical responses which can be linked to local polarizations described by the piezoelectric and electrostriction constant tensors [43][44][45]. This approach allows domain structures to be successfully mapped with excellent resolution (10 nm lateral resolution and displacements of sub-pm) [46].…”
Section: Multiferroic Devices For Multi-bit Memory Storagementioning
confidence: 99%