2015
DOI: 10.1016/j.physb.2015.07.032
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Effects of annealing on structure and composition of LSMO thin films

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Cited by 49 publications
(22 citation statements)
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References 42 publications
(61 reference statements)
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“…The (110) peak shifts toward low-angle direction at annealing temperature 800 ºC, attributed to the lattice constant increases because of Mn 4+ ionic changing to Mn 3+ and this in accordance with Ref. [12] and also higher temperature.…”
Section: Resultssupporting
confidence: 86%
“…The (110) peak shifts toward low-angle direction at annealing temperature 800 ºC, attributed to the lattice constant increases because of Mn 4+ ionic changing to Mn 3+ and this in accordance with Ref. [12] and also higher temperature.…”
Section: Resultssupporting
confidence: 86%
“…The optical images were taken with a CaiKang DMM‐200C optical microscope. AFM images were captured with Agilent 5500 SPM in tapping mode . Raman spectra, Raman mappings, and PL spectra were collected with WITec alpha 300 Raman microscope using 532 nm excitation with a laser power of 1 mW.…”
Section: Methodsmentioning
confidence: 99%
“…For XPS, a resolution of 0.65 eV of the spectrometer was chosen with a pass energy of 40 eV. The binding energies of all XPS were calibrated and referenced to the Femi level (E F ) of the sample [28][29][30][31]. The morphology of the perovskite films was measured ex situ using an Agilent 5500AFM/SPM system.…”
Section: Methodsmentioning
confidence: 99%