Effects of Annealing Conditions on C-axis Orientation of L10-FePt Films

Fuji, Yoshihiko; Miyazaki, T.; Okamoto, Satoshi; Kitakami, Osamu; Shimada, Yutaka; Koike, Junichi

doi:10.3379/jmsjmag.28.376

Cited by 5 publications

(2 citation statements)

References 8 publications

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“…[9][10][11] Two-step process consisting of low temperature film deposition followed by high temperature annealing has been tried for improving the crystallographic quality, the c-axis orientation, and the magnetic properties of L10-ordered FePt thin film. 12,13) The authors have confirmed that the two-step process is effective for not only the preparation of c-axis perpendicularly oriented thin films with good crystallographic quality but also for the preparation of L10-ordered films with very flat surfaces. 14,15) However, when the film thickness was decreased to be less than several nanometers, which would be the thickness range of L10-ordered FePt film for future device applications, de-wetting of FePt material took place on MgO substrate and the film morphology became discontinuous consisting of L10-ordered crystal islands.…”

Section: Introductionsupporting

confidence: 48%

Growth of L10-ordered Crystal in FePt Epitaxial Magnetic Thin Films on (001) Oriented Substrates

et al. 2018

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Effects of MgO cap-layer and substrate on L10-ordered FePt film structure are investigated by high-resolution transmission electron microscopy (TEM) for FePt thin films prepared on (001) oriented substrates by using a two-step method consisting of low temperature (200 °C) film formation followed by high temperature (600 °C) annealing. The TEM observation has shown that the crystal lattice of A1-FePt film (10 nm thickness) on MgO(001) substrate with 2-nm-thick MgO cap-layer is strained in the lateral direction to substrate surface, and by annealing the film structure varies to L10-ordered phase consisting of L10 (001) (100), (010) with the c-axis lying in-plane in addition to L10(001) variant. The lattice mismatch with substrate material is decreased by introduction of misfit dislocation and by lattice bending in L10-FePt crystal. The variant structures are interpreted to be influenced by the lattice strain in A1-FePt film during the L10-crystal nucleation stage at the high temperature annealing process. Based on the experimental results, a model to explain the phase transformation from disordered A1 to ordered L10 involving nucleation and growth of L10-crystal is proposed.

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Section: Introductionsupporting

confidence: 48%

Growth of L10-ordered Crystal in FePt Epitaxial Magnetic Thin Films on (001) Oriented Substrates

et al. 2018

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“…23 The tensile strain of this film was estimated at approximately 1% which could be enough to orient the ͓001͔ direction normal to the film plane. 24,25 The values of a are about 0.39 nm in each x. The c and the axial ratio ͑c / a͒ decrease with x, and those of gradients change at around x ϳ 0.34, whereas those of bulk crystals change at around x ϳ 0.22.…”

Section: Methodsmentioning

confidence: 96%

Study of ferro-antiferromagnetic transition in [001]-oriented L1 FePt1−xRhx film

Hasegawa

Miyahara

et al. 2009

Journal of Applied Physics

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Magnetic properties of [001]-oriented L10 FePt1−xRhx films (tFePtRh=6.12 nm) with Rh composition (x) of 0≤x≤0.40 were studied, and the magnetic phase in a composition-temperature plane was investigated. At room temperature, the films with 0≤x≤0.32 were in a ferromagnetic (FM) phase with a coercivity of several kilo-oersteds, and the films with 0.34≤x≤0.40 were in an antiferromagnetic (AF) phase. At x=0.32, which is close to the critical composition of the FM-AF transition at room temperature, the uniaxial magnetocrystalline anisotropy (Ku) was about 1.7×107 erg/cm3. A bit patterning process using the discontinuous FM-AF transition was studied. First, microfabricated FePt square films (1.7 nm thick) were prepared on the AF FePt0.64Rh0.36 film (6.7 nm thick). Second, those square films and the FePt0.64Rh0.36 film were mixed by annealing. The Fe and Pt atoms were thermally diffused into the FePt0.64Rh0.36 film locally, and the composition of the diffused areas changed to FM FePt0.72Rh0.28. A magnetic force microscopy study suggested that only the diffused areas changed from AF to FM phase. A minimum FM dot size of 300×300 nm2 was realized, and the FM dots were multidomain structures.

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Magnetic Anisotropy and Crystal Domain Variant in <inline-formula> <tex-math notation="LaTeX">$ {L} 1_{{0}}$ </tex-math> </inline-formula>-FePt Polycrystalline Films

et al. 2016

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Effects of Annealing Conditions on C-axis Orientation of L10-FePt Films

Cited by 5 publications

References 8 publications

Growth of <i>L</i>1<sub>0</sub>-ordered Crystal in FePt Epitaxial Magnetic Thin Films on (001) Oriented Substrates

Growth of <i>L</i>1<sub>0</sub>-ordered Crystal in FePt Epitaxial Magnetic Thin Films on (001) Oriented Substrates

Study of ferro-antiferromagnetic transition in [001]-oriented L1 FePt1−xRhx film

Magnetic Anisotropy and Crystal Domain Variant in <inline-formula> <tex-math notation="LaTeX">$ {L} 1_{{0}}$ </tex-math> </inline-formula>-FePt Polycrystalline Films

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