“…The process by which the interaction of light and material induces a variation in the refractive index of the material by the nonlinear Kerr effect, which results in diffraction ring patterns at the far fields, is known as SSPM. , The total refractive index of the material is given as n = n 0 + n 2 I , Δ n = n 2 I ( r , z ) represents the intensity-dependent changes in the refractive index, where n 0 and n 2 are the linear refractive index and NLR index of the material, respectively, and I ( r , z ) represents the spatially distributed incident intensity. , The output electric field having a radial component through the molecules for the input incident electric field will be ,, E ( z , r ) = E ( z , 0 ) e true( true − r 2 ω 2 ( z ) true) e true( − α L 2 true) e − i normalΨ ( z , r ) where E ( z ,0) denotes the amplitude of the input incident electric field, and ω( z ) represents the beam radius at different z positions. The phase shift Ψ( z , r ) is given by normalΨ ( z , r ) = Ψ L ( z , r ) + Ψ normalN normalL ( z , r ) where Ψ L ( z , r ) and Ψ NL ( z , r ) are the linear and nonlinear phase shifts, respectively.…”